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Kumar, Sanjiv, Ramana, J. V., Kumar, S. Vikram, Raju, V. S. (2005) Application of backscattering spectrometry for composition and thickness determination of zirconium oxide layers on autoclaved zircaloy. Journal of Radioanalytical and Nuclear Chemistry, 265. 441-446 doi:10.1007/s10967-005-0846-y

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Reference TypeJournal (article/letter/editorial)
TitleApplication of backscattering spectrometry for composition and thickness determination of zirconium oxide layers on autoclaved zircaloy
JournalJournal of Radioanalytical and Nuclear Chemistry
AuthorsKumar, SanjivAuthor
Ramana, J. V.Author
Kumar, S. VikramAuthor
Raju, V. S.Author
Year2005 (August)Volume265
PublisherSpringer Science and Business Media LLC
DOIdoi:10.1007/s10967-005-0846-ySearch in ResearchGate
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Mindat Ref. ID10084341Long-form Identifiermindat:1:5:10084341:9
GUID0
Full ReferenceKumar, Sanjiv, Ramana, J. V., Kumar, S. Vikram, Raju, V. S. (2005) Application of backscattering spectrometry for composition and thickness determination of zirconium oxide layers on autoclaved zircaloy. Journal of Radioanalytical and Nuclear Chemistry, 265. 441-446 doi:10.1007/s10967-005-0846-y
Plain TextKumar, Sanjiv, Ramana, J. V., Kumar, S. Vikram, Raju, V. S. (2005) Application of backscattering spectrometry for composition and thickness determination of zirconium oxide layers on autoclaved zircaloy. Journal of Radioanalytical and Nuclear Chemistry, 265. 441-446 doi:10.1007/s10967-005-0846-y
In(n.d.) Journal of Radioanalytical and Nuclear Chemistry Vol. 265. Springer Science and Business Media LLC

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Rao, Pritty, Reddy, G. L. N., Vikram Kumar, S., Ramana, J. V., Chattopadhyay, N., Basu, A. K., Srivastava, Seema, Sarin, R. K., Raju, V. S., Kumar, Sanjiv (2012) Simultaneous determination of 14N and 15N isotopes in opium by proton induced γ-ray emission technique. Journal of Radioanalytical and Nuclear Chemistry, 294. 127-130 doi:10.1007/s10967-011-1541-9
Reddy, G.L.N., Ramana, J.V., Kumar, Sanjiv, Kumar, S. Vikram, Raju, V.S. (2007) Investigations on the oxidation of zirconium nitride films in air by nuclear reaction analysis and backscattering spectrometry. Applied Surface Science, 253. 7230-7237 doi:10.1016/j.apsusc.2007.03.004
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Ramana, J. V., Raju, V. S., Gangadharan, S. (1997) Thin film characterisation using backscattering spectrometry. Journal of Radioanalytical and Nuclear Chemistry, 217. 293-295 doi:10.1007/bf02034459
Kumar, Sanjiv, Ramana, J. V., Raju, V. S., Arunachalam, J., Gangadharan, S. (1992) Determination of stoichiometry of cadmium telluride by XPS. Fresenius' Journal of Analytical Chemistry, 343. 879-880 doi:10.1007/bf00321957
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