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Kubo, M. K., Moriyama, H., Tsuruoka, Y., Sakamoto, S., Koseto, E., Saito, T., Nishiyama, K. (2008) Non-destructive elemental depth-profiling with muonic X-rays. Journal of Radioanalytical and Nuclear Chemistry, 278. 777-781 doi:10.1007/s10967-008-1610-x

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Reference TypeJournal (article/letter/editorial)
TitleNon-destructive elemental depth-profiling with muonic X-rays
JournalJournal of Radioanalytical and Nuclear Chemistry
AuthorsKubo, M. K.Author
Moriyama, H.Author
Tsuruoka, Y.Author
Sakamoto, S.Author
Koseto, E.Author
Saito, T.Author
Nishiyama, K.Author
Year2008 (December)Volume278
PublisherSpringer Science and Business Media LLC
DOIdoi:10.1007/s10967-008-1610-xSearch in ResearchGate
Generate Citation Formats
Mindat Ref. ID10085841Long-form Identifiermindat:1:5:10085841:3
GUID0
Full ReferenceKubo, M. K., Moriyama, H., Tsuruoka, Y., Sakamoto, S., Koseto, E., Saito, T., Nishiyama, K. (2008) Non-destructive elemental depth-profiling with muonic X-rays. Journal of Radioanalytical and Nuclear Chemistry, 278. 777-781 doi:10.1007/s10967-008-1610-x
Plain TextKubo, M. K., Moriyama, H., Tsuruoka, Y., Sakamoto, S., Koseto, E., Saito, T., Nishiyama, K. (2008) Non-destructive elemental depth-profiling with muonic X-rays. Journal of Radioanalytical and Nuclear Chemistry, 278. 777-781 doi:10.1007/s10967-008-1610-x
In(n.d.) Journal of Radioanalytical and Nuclear Chemistry Vol. 278. Springer Science and Business Media LLC

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