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Çetiner, S. M., Ünlü, K., Downing, R. G. (2008) Development and applications of time-of-flight neutron depth profiling (TOF-NDP). Journal of Radioanalytical and Nuclear Chemistry, 276. 623-630 doi:10.1007/s10967-008-0609-7

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Reference TypeJournal (article/letter/editorial)
TitleDevelopment and applications of time-of-flight neutron depth profiling (TOF-NDP)
JournalJournal of Radioanalytical and Nuclear Chemistry
AuthorsÇetiner, S. M.Author
Ünlü, K.Author
Downing, R. G.Author
Year2008 (June)Volume276
PublisherSpringer Science and Business Media LLC
DOIdoi:10.1007/s10967-008-0609-7Search in ResearchGate
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Mindat Ref. ID10085564Long-form Identifiermindat:1:5:10085564:1
GUID0
Full ReferenceÇetiner, S. M., Ünlü, K., Downing, R. G. (2008) Development and applications of time-of-flight neutron depth profiling (TOF-NDP). Journal of Radioanalytical and Nuclear Chemistry, 276. 623-630 doi:10.1007/s10967-008-0609-7
Plain TextÇetiner, S. M., Ünlü, K., Downing, R. G. (2008) Development and applications of time-of-flight neutron depth profiling (TOF-NDP). Journal of Radioanalytical and Nuclear Chemistry, 276. 623-630 doi:10.1007/s10967-008-0609-7
In(n.d.) Journal of Radioanalytical and Nuclear Chemistry Vol. 276. Springer Science and Business Media LLC

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Çetiner, S. M., Ünlü, K., Downing, R. G. (2007) Development of time-of-flight neutron depth profiling at Penn State University. Journal of Radioanalytical and Nuclear Chemistry, 271. 275-281 doi:10.1007/s10967-007-0204-3
Çetiner, Sacit M., Ünlü, Kenan (2007) Depth profiling of boron in ultra-shallow junction devices using time-of-flight neutron depth profiling (TOF-NDP). Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 579 (1). 148-152 doi:10.1016/j.nima.2007.04.027
Whitney, S. M., Downing, R. G., Biegalski, S., O’Kelly, D. S. (2008) Advancement of light-element neutron depth profiling at the University of Texas. Journal of Radioanalytical and Nuclear Chemistry, 276. 257-261 doi:10.1007/s10967-007-0442-4
Çetiner, N. Ö., Ünlü, K., Brenizer, J. S. (2008) Compton suppression system at Penn State Radiation Science and Engineering Center. Journal of Radioanalytical and Nuclear Chemistry, 276. 615-621 doi:10.1007/s10967-008-0608-8
Whitney, S. M., Biegalski, S. R. F., Downing, G. (2009) Benchmarking and analysis of 6Li neutron depth profiling of lithium ion cell electrodes. Journal of Radioanalytical and Nuclear Chemistry, 282. 173-176 doi:10.1007/s10967-009-0229-x
Downing, R. G., Maki, J. T., Fleming, R. F. (1987) Analytical applications of neutron depth profiling. Journal of Radioanalytical and Nuclear Chemistry Articles, 112 (1). 33-46 doi:10.1007/bf02037274
Ünlü, K., Wehring, B. W. (1997) Neutron depth profiling applications at The University of Texas research reactor. Journal of Radioanalytical and Nuclear Chemistry, 217. 273-278 doi:10.1007/bf02034455
Lamaze, G. P., Downing, R. G., Langland, J. K., Hwang, S. T. (1992) The new cold neutron depth profiling instrument at NIST. Journal of Radioanalytical and Nuclear Chemistry Articles, 160 (2). 315-325 doi:10.1007/bf02037107
Çelik, C., Ünlü, K., Ramakrishnan, K., Rajaraman, R., Narayanan, V., Irwin, M. J., Xie, Y. (2008) Thermal neutron induced soft error rate measurement in semiconductor memories and circuits. Journal of Radioanalytical and Nuclear Chemistry, 278. 509-512 doi:10.1007/s10967-008-0914-1
Kubo, M. K., Moriyama, H., Tsuruoka, Y., Sakamoto, S., Koseto, E., Saito, T., Nishiyama, K. (2008) Non-destructive elemental depth-profiling with muonic X-rays. Journal of Radioanalytical and Nuclear Chemistry, 278. 777-781 doi:10.1007/s10967-008-1610-x
Woodring, M. L., Egan, J. E., Kegel, G. H. R., DeSimone, D. J. (2008) Fast neutron induced fission neutron spectra below the incident energy. Journal of Radioanalytical and Nuclear Chemistry, 276. 707-712 doi:10.1007/s10967-008-0621-y
 
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