| Reference Type | Journal (article/letter/editorial) |
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| Title | Two-dimensional intensity distribution in high-angle double-crystal X-ray diffractometry (HADOX) |
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| Journal | Zeitschrift für Kristallographie - Crystalline Materials |
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| Authors | Soejima, Y. | Author |
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| Tomonaga, N. | Author |
| Onitsuka, H. | Author |
| Okazaki, A. | Author |
| Year | 1991 (January 1) | Volume | 195 |
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| Issue | 14 |
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| Publisher | Walter de Gruyter GmbH |
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| DOI | doi:10.1524/zkri.1991.195.14.161Search in ResearchGate |
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| Generate Citation Formats |
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| Mindat Ref. ID | 112449 | Long-form Identifier | mindat:1:5:112449:5 |
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| GUID | 0 |
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| Full Reference | Soejima, Y., Tomonaga, N., Onitsuka, H., Okazaki, A. (1991) Two-dimensional intensity distribution in high-angle double-crystal X-ray diffractometry (HADOX) Zeitschrift für Kristallographie - Crystalline Materials, 195 (14) 161 doi:10.1524/zkri.1991.195.14.161 |
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| Plain Text | Soejima, Y., Tomonaga, N., Onitsuka, H., Okazaki, A. (1991) Two-dimensional intensity distribution in high-angle double-crystal X-ray diffractometry (HADOX) Zeitschrift für Kristallographie - Crystalline Materials, 195 (14) 161 doi:10.1524/zkri.1991.195.14.161 |
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| In | (1991, January) Zeitschrift für Kristallographie - Crystalline Materials Vol. 195 (14) Walter de Gruyter GmbH |
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