Xu, Ruqing, Chiang, Tai C. (2005) Determination of phonon dispersion relations by X-ray thermal diffuse scattering. Zeitschrift für Kristallographie - Crystalline Materials, 220 (12_2005) 1009 doi:10.1524/zkri.2005.220.12_2005.1009
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Determination of phonon dispersion relations by X-ray thermal diffuse scattering | ||
Journal | Zeitschrift für Kristallographie - Crystalline Materials | ||
Authors | Xu, Ruqing | Author | |
Chiang, Tai C. | Author | ||
Year | 2005 (January 1) | Volume | 220 |
Issue | 12_2005 | ||
Publisher | Walter de Gruyter GmbH | ||
DOI | doi:10.1524/zkri.2005.220.12_2005.1009Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 116593 | Long-form Identifier | mindat:1:5:116593:1 |
GUID | 0 | ||
Full Reference | Xu, Ruqing, Chiang, Tai C. (2005) Determination of phonon dispersion relations by X-ray thermal diffuse scattering. Zeitschrift für Kristallographie - Crystalline Materials, 220 (12_2005) 1009 doi:10.1524/zkri.2005.220.12_2005.1009 | ||
Plain Text | Xu, Ruqing, Chiang, Tai C. (2005) Determination of phonon dispersion relations by X-ray thermal diffuse scattering. Zeitschrift für Kristallographie - Crystalline Materials, 220 (12_2005) 1009 doi:10.1524/zkri.2005.220.12_2005.1009 | ||
In | (2005, January) Zeitschrift für Kristallographie - Crystalline Materials Vol. 220 (12_2005) Walter de Gruyter GmbH |
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