| Reference Type | Journal (article/letter/editorial) |
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| Title | Problems in measuring diffuse X-ray scattering |
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| Journal | Zeitschrift für Kristallographie - Crystalline Materials |
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| Authors | Welberry, T. Richard | Author |
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| Goossens, Darren J. | Author |
| Heerdegen, Aidan P. | Author |
| Lee, Peter L. | Author |
| Year | 2005 (January 1) | Volume | 220 |
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| Issue | 12_2005 |
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| Publisher | Walter de Gruyter GmbH |
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| DOI | doi:10.1524/zkri.2005.220.12_2005.1052Search in ResearchGate |
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| Generate Citation Formats |
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| Mindat Ref. ID | 116598 | Long-form Identifier | mindat:1:5:116598:6 |
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| GUID | 0 |
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| Full Reference | Welberry, T. Richard, Goossens, Darren J., Heerdegen, Aidan P., Lee, Peter L. (2005) Problems in measuring diffuse X-ray scattering. Zeitschrift für Kristallographie - Crystalline Materials, 220 (12_2005) 1052 doi:10.1524/zkri.2005.220.12_2005.1052 |
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| Plain Text | Welberry, T. Richard, Goossens, Darren J., Heerdegen, Aidan P., Lee, Peter L. (2005) Problems in measuring diffuse X-ray scattering. Zeitschrift für Kristallographie - Crystalline Materials, 220 (12_2005) 1052 doi:10.1524/zkri.2005.220.12_2005.1052 |
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| In | (2005, January) Zeitschrift für Kristallographie - Crystalline Materials Vol. 220 (12_2005) Walter de Gruyter GmbH |
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