Kužel, Radomír (2007) Kinematical diffraction by distorted crystals – dislocation X-ray line broadening. Zeitschrift für Kristallographie - Crystalline Materials, 222 (3-4) 136 doi:10.1524/zkri.2007.222.3-4.136
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Kinematical diffraction by distorted crystals – dislocation X-ray line broadening | ||
| Journal | Zeitschrift für Kristallographie - Crystalline Materials | ||
| Authors | Kužel, Radomír | Author | |
| Year | 2007 (January 1) | Volume | 222 |
| Issue | 3-4 | ||
| Publisher | Walter de Gruyter GmbH | ||
| DOI | doi:10.1524/zkri.2007.222.3-4.136Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 116887 | Long-form Identifier | mindat:1:5:116887:1 |
| GUID | 0 | ||
| Full Reference | Kužel, Radomír (2007) Kinematical diffraction by distorted crystals – dislocation X-ray line broadening. Zeitschrift für Kristallographie - Crystalline Materials, 222 (3-4) 136 doi:10.1524/zkri.2007.222.3-4.136 | ||
| Plain Text | Kužel, Radomír (2007) Kinematical diffraction by distorted crystals – dislocation X-ray line broadening. Zeitschrift für Kristallographie - Crystalline Materials, 222 (3-4) 136 doi:10.1524/zkri.2007.222.3-4.136 | ||
| In | (2007, January) Zeitschrift für Kristallographie - Crystalline Materials Vol. 222 (3-4) Walter de Gruyter GmbH | ||
| Abstract/Notes | The current state of the description and evaluation of dislocation-induced X-ray diffraction line broadening has been reviewed. The diffraction-line broadening can be analyzed in terms of line width, moments or Fourier coefficients. However, in the last years, whole pattern fitting has become the most popular method of evaluation. The line width is proportional to the Burgers vector of dislocations, to the square-root of dislocation density and to the so-called orientation (contrast) factor. The orientation factor determines the | ||
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