Kotrlý, Marek (2007) Using X-ray diffraction in forensic science. Zeitschrift für Kristallographie - Crystalline Materials, 222 (3-4) 193 doi:10.1524/zkri.2007.222.3-4.193
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Using X-ray diffraction in forensic science | ||
| Journal | Zeitschrift für Kristallographie - Crystalline Materials | ||
| Authors | Kotrlý, Marek | Author | |
| Year | 2007 (January 1) | Volume | 222 |
| Issue | 3-4 | ||
| Publisher | Walter de Gruyter GmbH | ||
| DOI | doi:10.1524/zkri.2007.222.3-4.193Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 116892 | Long-form Identifier | mindat:1:5:116892:5 |
| GUID | 0 | ||
| Full Reference | Kotrlý, Marek (2007) Using X-ray diffraction in forensic science. Zeitschrift für Kristallographie - Crystalline Materials, 222 (3-4) 193 doi:10.1524/zkri.2007.222.3-4.193 | ||
| Plain Text | Kotrlý, Marek (2007) Using X-ray diffraction in forensic science. Zeitschrift für Kristallographie - Crystalline Materials, 222 (3-4) 193 doi:10.1524/zkri.2007.222.3-4.193 | ||
| In | (2007, January) Zeitschrift für Kristallographie - Crystalline Materials Vol. 222 (3-4) Walter de Gruyter GmbH | ||
| Abstract/Notes | The majority of expert examination in forensic science is concerned with comparison, determination, and description of diversified samples. X-ray diffraction (powdered and/or single crystal) is bringing big benefits and analytical possibilities into forensic expert work, which are not easily provided by other methods. XRD methods are used in combination with other analytical methods (SEM with EDS/WDS, micro XRF, optical microscopy, FTIR, etc.).Importance of XRD phase analysis in forensic science lies namely in: analysis of relatively small-volume samples, relatively non-destructive, exact phase analysis, quantitative analysis (in majority of cases). And method is conclusive for a court. | ||
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