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Boscherini, F., Joyce, J. J., Ruckman, M. W., Weaver, J. H. (1987) High-resolution photoemission study of Co/Si(111) interface formation. Physical Review B, 35 (9) 4216-4220 doi:10.1103/physrevb.35.4216

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Reference TypeJournal (article/letter/editorial)
TitleHigh-resolution photoemission study of Co/Si(111) interface formation
JournalPhysical Review B
AuthorsBoscherini, F.Author
Joyce, J. J.Author
Ruckman, M. W.Author
Weaver, J. H.Author
Year1987 (March 15)Volume35
Issue9
PublisherAmerican Physical Society (APS)
DOIdoi:10.1103/physrevb.35.4216Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID14095939Long-form Identifiermindat:1:5:14095939:2
GUID0
Full ReferenceBoscherini, F., Joyce, J. J., Ruckman, M. W., Weaver, J. H. (1987) High-resolution photoemission study of Co/Si(111) interface formation. Physical Review B, 35 (9) 4216-4220 doi:10.1103/physrevb.35.4216
Plain TextBoscherini, F., Joyce, J. J., Ruckman, M. W., Weaver, J. H. (1987) High-resolution photoemission study of Co/Si(111) interface formation. Physical Review B, 35 (9) 4216-4220 doi:10.1103/physrevb.35.4216
In(1987, March) Physical Review B Vol. 35 (9) American Physical Society (APS)


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