Reference Type | Journal (article/letter/editorial) |
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Title | High-resolution photoemission study of Co/Si(111) interface formation |
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Journal | Physical Review B |
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Authors | Boscherini, F. | Author |
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Joyce, J. J. | Author |
Ruckman, M. W. | Author |
Weaver, J. H. | Author |
Year | 1987 (March 15) | Volume | 35 |
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Issue | 9 |
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Publisher | American Physical Society (APS) |
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DOI | doi:10.1103/physrevb.35.4216Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 14095939 | Long-form Identifier | mindat:1:5:14095939:2 |
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|
GUID | 0 |
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Full Reference | Boscherini, F., Joyce, J. J., Ruckman, M. W., Weaver, J. H. (1987) High-resolution photoemission study of Co/Si(111) interface formation. Physical Review B, 35 (9) 4216-4220 doi:10.1103/physrevb.35.4216 |
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Plain Text | Boscherini, F., Joyce, J. J., Ruckman, M. W., Weaver, J. H. (1987) High-resolution photoemission study of Co/Si(111) interface formation. Physical Review B, 35 (9) 4216-4220 doi:10.1103/physrevb.35.4216 |
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In | (1987, March) Physical Review B Vol. 35 (9) American Physical Society (APS) |
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