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Holý, V., Roch, T., Stangl, J., Daniel, A., Bauer, G., Metzger, T. H., Zhu, Y. H., Brunner, K., Abstreiter, G. (2001) Grazing incidence small-angle x-ray scattering study of self-organized SiGe wires. Physical Review B, 63 (20) doi:10.1103/physrevb.63.205318

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Reference TypeJournal (article/letter/editorial)
TitleGrazing incidence small-angle x-ray scattering study of self-organized SiGe wires
JournalPhysical Review B
AuthorsHolý, V.Author
Roch, T.Author
Stangl, J.Author
Daniel, A.Author
Bauer, G.Author
Metzger, T. H.Author
Zhu, Y. H.Author
Brunner, K.Author
Abstreiter, G.Author
Year2001 (May 2)Volume63
Issue20
PublisherAmerican Physical Society (APS)
DOIdoi:10.1103/physrevb.63.205318Search in ResearchGate
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Mindat Ref. ID14156721Long-form Identifiermindat:1:5:14156721:3
GUID0
Full ReferenceHolý, V., Roch, T., Stangl, J., Daniel, A., Bauer, G., Metzger, T. H., Zhu, Y. H., Brunner, K., Abstreiter, G. (2001) Grazing incidence small-angle x-ray scattering study of self-organized SiGe wires. Physical Review B, 63 (20) doi:10.1103/physrevb.63.205318
Plain TextHolý, V., Roch, T., Stangl, J., Daniel, A., Bauer, G., Metzger, T. H., Zhu, Y. H., Brunner, K., Abstreiter, G. (2001) Grazing incidence small-angle x-ray scattering study of self-organized SiGe wires. Physical Review B, 63 (20) doi:10.1103/physrevb.63.205318
In(2001, May) Physical Review B Vol. 63 (20) American Physical Society (APS)

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Stangl, J., Holý, V., Roch, T., Daniel, A., Bauer, G., Zhu, J., Brunner, K., Abstreiter, G. (2000) Grazing incidence small-angle x-ray scattering study of buried and free-standing SiGe islands in a SiGe/Si superlattice. Physical Review B, 62 (11) 7229-7236 doi:10.1103/physrevb.62.7229
Roch, T., Hol�, V., Stangl, J., H�flinger, E., Daniel, A., Bauer, G., Kegel, I., Metzger, H., Zhu, J., Brunner, K., Abstreiter, G. (2001) Structural Investigations on Self-Organized Si/SiGe Islands by Grazing Incidence Small Angle X-Ray Scattering. physica status solidi (b), 224 (1). 241-245 doi:10.1002/1521-3951(200103)224:1<241::aid-pssb241>3.0.co;2-b
Roch, T., Holý, V., Hesse, A., Stangl, J., Fromherz, T., Bauer, G., Metzger, T. H., Ferrer, S. (2002) Strain in buried self-assembled SiGe wires studied by grazing-incidence x-ray diffraction. Physical Review B, 65 (24) doi:10.1103/physrevb.65.245324
Roch, T, Holý, V, Daniel, A, Höflinger, E, Meduna, M, Metzger, T H, Bauer, G, Zhu, J, Brunner, K, Abstreiter, G (2001) X-ray studies on self-organized wires in SiGe/Si multilayers. Journal of Physics D: Applied Physics, 34. doi:10.1088/0022-3727/34/10a/302
Meduňa, M., Holý, V., Roch, T., Stangl, J., Bauer, G., Zhu, J., Brunner, K., Abstreiter, G. (2001) X-ray reflectivity of self-assembled structures in SiGe multilayers and comparison with atomic force microscopy. Journal of Applied Physics, 89 (9). 4836-4842 doi:10.1063/1.1359156
Zozulya, A. V., Yefanov, O. M., Vartanyants, I. A., Mundboth, K., Mocuta, C., Metzger, T. H., Stangl, J., Bauer, G., Boeck, T., Schmidbauer, M. (2008) Imaging of nanoislands in coherent grazing-incidence small-angle x-ray scattering experiments. Physical Review B, 78 (12) doi:10.1103/physrevb.78.121304
Stangl, J., Holý, V., Mikulı́k, P., Bauer, G., Kegel, I., Metzger, T. H., Schmidt, O. G., Lange, C., Eberl, K. (1999) Self-assembled carbon-induced germanium quantum dots studied by grazing-incidence small-angle x-ray scattering. Applied Physics Letters, 74 (25). 3785-3787 doi:10.1063/1.124179
Stangl, J., Daniel, A., Holý, V., Roch, T., Bauer, G., Kegel, I., Metzger, T. H., Wiebach, Th., Schmidt, O. G., Eberl, K. (2001) Strain and composition distribution in uncapped SiGe islands from x-ray diffraction. Applied Physics Letters, 79 (10). 1474-1476 doi:10.1063/1.1392975
Holý, V., Darhuber, A. A., Stangl, J., Zerlauth, S., Schäffler, F., Bauer, G., Darowski, N., Lübbert, D., Pietsch, U., Vávra, I. (1998) Coplanar and grazing incidence x-ray-diffraction investigation of self-organized SiGe quantum dot multilayers. Physical Review B, 58 (12) 7934-7943 doi:10.1103/physrevb.58.7934
Kegel, I., Metzger, T. H., Lorke, A., Peisl, J., Stangl, J., Bauer, G., Nordlund, K., Schoenfeld, W. V., Petroff, P. M. (2001) Determination of strain fields and composition of self-organized quantum dots using x-ray diffraction. Physical Review B, 63 (3) doi:10.1103/physrevb.63.035318
Holý, V., Meduňa, M., Stangl, J., Roch, T., Bauer, G. (2002) Investigation of Morphology and Chemical Composition of Self-Organized Semiconductor Quantum Dots and Wires by X-Ray Scattering. Acta Physica Polonica A, 102 (1). 7-19 doi:10.12693/aphyspola.102.7
 
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