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Roch, T, Holý, V, Daniel, A, Höflinger, E, Meduna, M, Metzger, T H, Bauer, G, Zhu, J, Brunner, K, Abstreiter, G (2001) X-ray studies on self-organized wires in SiGe/Si multilayers. Journal of Physics D: Applied Physics, 34. doi:10.1088/0022-3727/34/10a/302

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Reference TypeJournal (article/letter/editorial)
TitleX-ray studies on self-organized wires in SiGe/Si multilayers
JournalJournal of Physics D: Applied Physics
AuthorsRoch, TAuthor
Holý, VAuthor
Daniel, AAuthor
Höflinger, EAuthor
Meduna, MAuthor
Metzger, T HAuthor
Bauer, GAuthor
Zhu, JAuthor
Brunner, KAuthor
Abstreiter, GAuthor
Year2001 (May 21)Volume34
PublisherIOP Publishing
DOIdoi:10.1088/0022-3727/34/10a/302Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID5668452Long-form Identifiermindat:1:5:5668452:0
GUID0
Full ReferenceRoch, T, Holý, V, Daniel, A, Höflinger, E, Meduna, M, Metzger, T H, Bauer, G, Zhu, J, Brunner, K, Abstreiter, G (2001) X-ray studies on self-organized wires in SiGe/Si multilayers. Journal of Physics D: Applied Physics, 34. doi:10.1088/0022-3727/34/10a/302
Plain TextRoch, T, Holý, V, Daniel, A, Höflinger, E, Meduna, M, Metzger, T H, Bauer, G, Zhu, J, Brunner, K, Abstreiter, G (2001) X-ray studies on self-organized wires in SiGe/Si multilayers. Journal of Physics D: Applied Physics, 34. doi:10.1088/0022-3727/34/10a/302
In(2000) Journal of Physics D: Applied Physics Vol. 34. IOP Publishing

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Meduna, M, Holý, V, Roch, T, Bauer, G, Schmidt, O G, Eberl, K (2001) X-ray reflectivity from self-assembled structures in Ge/Si superlattices. Journal of Physics D: Applied Physics, 34. doi:10.1088/0022-3727/34/10a/340
Holý, V., Roch, T., Stangl, J., Daniel, A., Bauer, G., Metzger, T. H., Zhu, Y. H., Brunner, K., Abstreiter, G. (2001) Grazing incidence small-angle x-ray scattering study of self-organized SiGe wires. Physical Review B, 63 (20) doi:10.1103/physrevb.63.205318
Stangl, J, Holý, V, Darhuber, A A, Mikulík, P, Bauer, G, Zhu, J, Brunner, K, Abstreiter, G (1999) High-resolution x-ray diffraction on self-organized step bunches of Si1-xGexgrown on (113)-oriented Si. Journal of Physics D: Applied Physics, 32. doi:10.1088/0022-3727/32/10a/315
Meduňa, M., Holý, V., Roch, T., Stangl, J., Bauer, G., Zhu, J., Brunner, K., Abstreiter, G. (2001) X-ray reflectivity of self-assembled structures in SiGe multilayers and comparison with atomic force microscopy. Journal of Applied Physics, 89 (9). 4836-4842 doi:10.1063/1.1359156
Daniel, A, Holý, V, Zhuang, Y, Roch, T, Grenzer, J, Bochnícek, Z, Bauer, G (2001) GID study of strains in Si due to patterned SiO2. Journal of Physics D: Applied Physics, 34. doi:10.1088/0022-3727/34/10a/341
Holý, V, Stangl, J, Springholz, G, Pinczolits, M, Bauer, G (2001) High-resolution x-ray diffraction from self-organized PbSe/PbEuTe quantum dot superlattices. Journal of Physics D: Applied Physics, 34. doi:10.1088/0022-3727/34/10a/301
Roch, T., Hol�, V., Stangl, J., H�flinger, E., Daniel, A., Bauer, G., Kegel, I., Metzger, H., Zhu, J., Brunner, K., Abstreiter, G. (2001) Structural Investigations on Self-Organized Si/SiGe Islands by Grazing Incidence Small Angle X-Ray Scattering. physica status solidi (b), 224 (1). 241-245 doi:10.1002/1521-3951(200103)224:1<241::aid-pssb241>3.0.co;2-b
Stangl, J., Holý, V., Roch, T., Daniel, A., Bauer, G., Zhu, J., Brunner, K., Abstreiter, G. (2000) Grazing incidence small-angle x-ray scattering study of buried and free-standing SiGe islands in a SiGe/Si superlattice. Physical Review B, 62 (11) 7229-7236 doi:10.1103/physrevb.62.7229
Grim, J, Holý, V, Kubena, J, Stangl, J, Darhuber, A A, Zerlauth, S, Schäffler, F, Bauer, G (1999) Diffuse x-ray reflectivity of strain-compensated Si/SiGe/SiC multilayers. Journal of Physics D: Applied Physics, 32. doi:10.1088/0022-3727/32/10a/342
Stangl, J., Daniel, A., Holý, V., Roch, T., Bauer, G., Kegel, I., Metzger, T. H., Wiebach, Th., Schmidt, O. G., Eberl, K. (2001) Strain and composition distribution in uncapped SiGe islands from x-ray diffraction. Applied Physics Letters, 79 (10). 1474-1476 doi:10.1063/1.1392975
Roch, T., Holý, V., Hesse, A., Stangl, J., Fromherz, T., Bauer, G., Metzger, T. H., Ferrer, S. (2002) Strain in buried self-assembled SiGe wires studied by grazing-incidence x-ray diffraction. Physical Review B, 65 (24) doi:10.1103/physrevb.65.245324
 
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