Grim, J, Holý, V, Kubena, J, Stangl, J, Darhuber, A A, Zerlauth, S, Schäffler, F, Bauer, G (1999) Diffuse x-ray reflectivity of strain-compensated Si/SiGe/SiC multilayers. Journal of Physics D: Applied Physics, 32. doi:10.1088/0022-3727/32/10a/342
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Diffuse x-ray reflectivity of strain-compensated Si/SiGe/SiC multilayers | ||
Journal | Journal of Physics D: Applied Physics | ||
Authors | Grim, J | Author | |
Holý, V | Author | ||
Kubena, J | Author | ||
Stangl, J | Author | ||
Darhuber, A A | Author | ||
Zerlauth, S | Author | ||
Schäffler, F | Author | ||
Bauer, G | Author | ||
Year | 1999 (May 21) | Volume | 32 |
Publisher | IOP Publishing | ||
DOI | doi:10.1088/0022-3727/32/10a/342Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 5667431 | Long-form Identifier | mindat:1:5:5667431:0 |
GUID | 0 | ||
Full Reference | Grim, J, Holý, V, Kubena, J, Stangl, J, Darhuber, A A, Zerlauth, S, Schäffler, F, Bauer, G (1999) Diffuse x-ray reflectivity of strain-compensated Si/SiGe/SiC multilayers. Journal of Physics D: Applied Physics, 32. doi:10.1088/0022-3727/32/10a/342 | ||
Plain Text | Grim, J, Holý, V, Kubena, J, Stangl, J, Darhuber, A A, Zerlauth, S, Schäffler, F, Bauer, G (1999) Diffuse x-ray reflectivity of strain-compensated Si/SiGe/SiC multilayers. Journal of Physics D: Applied Physics, 32. doi:10.1088/0022-3727/32/10a/342 | ||
In | (1999) Journal of Physics D: Applied Physics Vol. 32. IOP Publishing |
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