Reference Type | Journal (article/letter/editorial) |
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Title | Temperature and fluence effects on the evolution of regular surface morphologies on ion-sputtered Si(111) |
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Journal | Physical Review B |
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Authors | Brown, Ari-David | Author |
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Erlebacher, Jonah | Author |
Year | 2005 (August 19) | Volume | 72 |
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Issue | 7 |
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Publisher | American Physical Society (APS) |
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DOI | doi:10.1103/physrevb.72.075350Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 14181872 | Long-form Identifier | mindat:1:5:14181872:8 |
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GUID | 0 |
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Full Reference | Brown, Ari-David, Erlebacher, Jonah (2005) Temperature and fluence effects on the evolution of regular surface morphologies on ion-sputtered Si(111) Physical Review B, 72 (7) doi:10.1103/physrevb.72.075350 |
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Plain Text | Brown, Ari-David, Erlebacher, Jonah (2005) Temperature and fluence effects on the evolution of regular surface morphologies on ion-sputtered Si(111) Physical Review B, 72 (7) doi:10.1103/physrevb.72.075350 |
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In | (2005, August) Physical Review B Vol. 72 (7) American Physical Society (APS) |
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