Xu, Yingnian (1996) Study of a Commercial SiO2 Sol and Gel by Small Angle X-ray Scattering: Effect of Sample Thickness and Interpretation by Means of Smoluchowski Scheme. Clays and Clay Minerals, 44 (2) 197-213 doi:10.1346/ccmn.1996.0440205
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Study of a Commercial SiO2 Sol and Gel by Small Angle X-ray Scattering: Effect of Sample Thickness and Interpretation by Means of Smoluchowski Scheme | ||
| Journal | Clays and Clay Minerals | ||
| Authors | Xu, Yingnian | Author | |
| Year | 1996 | Volume | 44 |
| Issue | 2 | ||
| Publisher | Springer Science and Business Media LLC | ||
| DOI | doi:10.1346/ccmn.1996.0440205Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 147146 | Long-form Identifier | mindat:1:5:147146:9 |
| GUID | 0 | ||
| Full Reference | Xu, Yingnian (1996) Study of a Commercial SiO2 Sol and Gel by Small Angle X-ray Scattering: Effect of Sample Thickness and Interpretation by Means of Smoluchowski Scheme. Clays and Clay Minerals, 44 (2) 197-213 doi:10.1346/ccmn.1996.0440205 | ||
| Plain Text | Xu, Yingnian (1996) Study of a Commercial SiO2 Sol and Gel by Small Angle X-ray Scattering: Effect of Sample Thickness and Interpretation by Means of Smoluchowski Scheme. Clays and Clay Minerals, 44 (2) 197-213 doi:10.1346/ccmn.1996.0440205 | ||
| In | (1996) Clays and Clay Minerals Vol. 44 (2) Springer Science and Business Media LLC | ||
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