| Reference Type | Journal (article/letter/editorial) |
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| Title | Measurement of illite particle thickness using a direct Fourier transform of small-angle X-ray scattering data |
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| Journal | Clays and Clay Minerals |
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| Authors | Shang, Chao | Author |
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| Rice, James A. | Author |
| Eberl, Dennis D. | Author |
| Lin, Jar-Shyong | Author |
| Year | 2003 (June 1) | Volume | 51 |
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| Issue | 3 |
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| Publisher | Springer Science and Business Media LLC |
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| DOI | doi:10.1346/ccmn.2003.0510305Search in ResearchGate |
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| Generate Citation Formats |
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| Mindat Ref. ID | 147812 | Long-form Identifier | mindat:1:5:147812:3 |
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|
| GUID | 0 |
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| Full Reference | Shang, Chao, Rice, James A., Eberl, Dennis D., Lin, Jar-Shyong (2003) Measurement of illite particle thickness using a direct Fourier transform of small-angle X-ray scattering data. Clays and Clay Minerals, 51 (3) 293-300 doi:10.1346/ccmn.2003.0510305 |
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| Plain Text | Shang, Chao, Rice, James A., Eberl, Dennis D., Lin, Jar-Shyong (2003) Measurement of illite particle thickness using a direct Fourier transform of small-angle X-ray scattering data. Clays and Clay Minerals, 51 (3) 293-300 doi:10.1346/ccmn.2003.0510305 |
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| In | (2003, June) Clays and Clay Minerals Vol. 51 (3) Springer Science and Business Media LLC |
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