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Iijima, Sumio, Hibi, Tadatoshi (1966) Electronmicroscopic Observations of the Effect of Electron Irradiation and Print-Out Effect on AgBr Crystal. Japanese Journal of Applied Physics, 5 (12) 1183-1190 doi:10.1143/jjap.5.1183

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Reference TypeJournal (article/letter/editorial)
TitleElectronmicroscopic Observations of the Effect of Electron Irradiation and Print-Out Effect on AgBr Crystal
JournalJapanese Journal of Applied Physics
AuthorsIijima, SumioAuthor
Hibi, TadatoshiAuthor
Year1966 (December)Volume5
Issue12
PublisherJapan Society of Applied Physics
DOIdoi:10.1143/jjap.5.1183Search in ResearchGate
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Mindat Ref. ID14976444Long-form Identifiermindat:1:5:14976444:7
GUID0
Full ReferenceIijima, Sumio, Hibi, Tadatoshi (1966) Electronmicroscopic Observations of the Effect of Electron Irradiation and Print-Out Effect on AgBr Crystal. Japanese Journal of Applied Physics, 5 (12) 1183-1190 doi:10.1143/jjap.5.1183
Plain TextIijima, Sumio, Hibi, Tadatoshi (1966) Electronmicroscopic Observations of the Effect of Electron Irradiation and Print-Out Effect on AgBr Crystal. Japanese Journal of Applied Physics, 5 (12) 1183-1190 doi:10.1143/jjap.5.1183
In(1966, December) Japanese Journal of Applied Physics Vol. 5 (12) Japan Society of Applied Physics

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Iijima, Sumio, Hibi, Tadatosi (1969) Electronmicroscopic Observation of Print-Out Effect on AgBr Microcrystals. Japanese Journal of Applied Physics, 8 (8) 982-992 doi:10.1143/jjap.8.982
Iijima, Sumio (1969) Electronmicroscopic Observation of Print-Out Effect on AgBr Crystals Obtained from Low Sensitive Photographic Plate. Japanese Journal of Applied Physics, 8 (12) 1377-1389 doi:10.1143/jjap.8.1377
Ohno, Yutaka, Takeda, Seiji, Ichihashi, Toshinari, Iijima, Sumio (2007) Fabrication of Short-Range Ordered Nanoholes on Silicon Surfaces by Electron Irradiation. Japanese Journal of Applied Physics, 46 (1) 434-439 doi:10.1143/jjap.46.434
Munakata, Chusuke (1966) Electron Voltaic Effect at a Grain Boundary of CdS. Japanese Journal of Applied Physics, 5 (12) 1251 doi:10.1143/jjap.5.1251
Iijima, Sumio (1984) Ultra-Fine Spherical Particles of γ-Alumina: Electron Microscopy of Crystal Structure and Surface Morphology at Atomic Resolution. Japanese Journal of Applied Physics, 23. doi:10.1143/jjap.23.l347
Inoue, Tomoyasu (1977) Electron Irradiation Effect in the Quantitative Auger Analysis of PSG. Japanese Journal of Applied Physics, 16 (5) 851-852 doi:10.1143/jjap.16.851
Iijima, Sumio (1987) Fine Particles of Silicon. I. Crystal Growth of Spherical Particles of Si. Japanese Journal of Applied Physics, 26. 357-364 doi:10.1143/jjap.26.357
Nihey, Fumiyuki, Hongo, Hiroo, Ochiai, Yukinori, Yudasaka, Masako, Iijima, Sumio (2003) Carbon-Nanotube Field-Effect Transistors with Very High Intrinsic Transconductance. Japanese Journal of Applied Physics, 42. doi:10.1143/jjap.42.l1288
Nihey, Fumiyuki, Hongo, Hiroo, Yudasaka, Masako, Iijima, Sumio (2002) A Top-Gate Carbon-Nanotube Field-Effect Transistor with a Titanium-Dioxide Insulator. Japanese Journal of Applied Physics, 41. doi:10.1143/jjap.41.l1049
Edagawa, Hiroshi, Morita, Yoshinori, Maekawa, Shun-ichi, Inuishi, Yoshio (1966) γ Ray Irradiation on MOS Field Effect Transistor. Japanese Journal of Applied Physics, 5 (3) 256-257 doi:10.1143/jjap.5.256
Matsui, Hajime, Demizu, Kiyoshi, Abe, Haruhiko, Komiya, Hiroyoshi (1973) The Effect of Gas Plasma Irradiation on Transistor. Japanese Journal of Applied Physics, 12 (5) 767-768 doi:10.1143/jjap.12.767
 
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