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Takano, Yukio, Kohn, Kay, Kikuta, Seishi, Kohra, Kazutake (1970) X-Ray Studies of Dislocation Structures in a Sapphire Crystal. Japanese Journal of Applied Physics, 9 (7) 847-848 doi:10.1143/jjap.9.847

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Reference TypeJournal (article/letter/editorial)
TitleX-Ray Studies of Dislocation Structures in a Sapphire Crystal
JournalJapanese Journal of Applied Physics
AuthorsTakano, YukioAuthor
Kohn, KayAuthor
Kikuta, SeishiAuthor
Kohra, KazutakeAuthor
Year1970 (July)Volume9
Issue7
PublisherJapan Society of Applied Physics
DOIdoi:10.1143/jjap.9.847Search in ResearchGate
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Mindat Ref. ID14978048Long-form Identifiermindat:1:5:14978048:5
GUID0
Full ReferenceTakano, Yukio, Kohn, Kay, Kikuta, Seishi, Kohra, Kazutake (1970) X-Ray Studies of Dislocation Structures in a Sapphire Crystal. Japanese Journal of Applied Physics, 9 (7) 847-848 doi:10.1143/jjap.9.847
Plain TextTakano, Yukio, Kohn, Kay, Kikuta, Seishi, Kohra, Kazutake (1970) X-Ray Studies of Dislocation Structures in a Sapphire Crystal. Japanese Journal of Applied Physics, 9 (7) 847-848 doi:10.1143/jjap.9.847
In(1970, July) Japanese Journal of Applied Physics Vol. 9 (7) Japan Society of Applied Physics

See Also

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Kohra, Kazutake, Takano, Yukio (1968) A New Method of X-Ray Diffraction Topography Using Monochromatic Divergent Beams Made by a Curved Crystal. Japanese Journal of Applied Physics, 7 (9) 982-988 doi:10.1143/jjap.7.982
Takano, Yukio, Kohra, Kazutake (1974) A Modification for X-Ray Diffraction Topography of Oscillating Method Using Monochromatic Divergent Beams. Japanese Journal of Applied Physics, 13 (9) 1335-1338 doi:10.1143/jjap.13.1335
Kikuta, Seishi, Kohra, Kazutake, Sugita, Yoshimitsu (1966) Measurements on Local Variations in Spacing and Orientation of the Lattice Plane of Silicon Single Crystals by X-Ray Double-Crystal Topography. Japanese Journal of Applied Physics, 5 (11) 1047-1055 doi:10.1143/jjap.5.1047
Ishikawa, Tetsuya, Kikuta, Seishi, Kohra, Kazutaka (1985) Angle-Resolved Plane Wave X-Ray Topography. Japanese Journal of Applied Physics, 24. doi:10.1143/jjap.24.l559
Kohra, Kazutake, Hashizume, Hiroo, Yoshimura, Jun-ichi (1970) X-Ray Diffraction Topography Utilizing Double-Crystal Arrangement of (+, +) or Non-Parallel (+, -) Setting. Japanese Journal of Applied Physics, 9 (9) 1029-1038 doi:10.1143/jjap.9.1029
Kikuta, Seishi, Kohra, Kazutake (1966) Effect of Impurities on the Diffraction Curves of X-Rays from Dislocation-Free Silicon Crystals. Journal of the Physical Society of Japan, 21 (7). 1449 doi:10.1143/jpsj.21.1449
Aoki, Sadao, Kikuta, Seishi (1974) X-Ray Holographic Microscopy. Japanese Journal of Applied Physics, 13 (9) 1385-1392 doi:10.1143/jjap.13.1385
Kikuta, Seishi, Kohra, Kazutake (1970) X-Ray Crystal Collimators Using Successive Asymmetric Diffractions and Their Applications to Measurements of Diffraction Curves. I. General Considerations on Collimators. Journal of the Physical Society of Japan, 29 (5). 1322-1328 doi:10.1143/jpsj.29.1322
Takano, Yukio, Kohra, Kazutaka (1971) Contac Microradiography with Monochromatic Divergent X-Rays. Japanese Journal of Applied Physics, 10 (4) 476-479 doi:10.1143/jjap.10.476
Kohra, Kazutake, Kikuta, Seishi, Annaka, Shoichi (1965) Temperature Effect on the Profile of X-Ray Diffraction of the Bragg Case from a Germanium Single Crystal. Journal of the Physical Society of Japan, 20 (10). 1964-1965 doi:10.1143/jpsj.20.1964
Ito, Masahisa, Kohra, Kazutake (1979) X-Ray Observation during Polarization Reversal of Ferroelectric NaNO2. Japanese Journal of Applied Physics, 18 (3) 527-531 doi:10.1143/jjap.18.527
 
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