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Kohra, Kazutake, Hashizume, Hiroo, Yoshimura, Jun-ichi (1970) X-Ray Diffraction Topography Utilizing Double-Crystal Arrangement of (+, +) or Non-Parallel (+, -) Setting. Japanese Journal of Applied Physics, 9 (9) 1029-1038 doi:10.1143/jjap.9.1029

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Reference TypeJournal (article/letter/editorial)
TitleX-Ray Diffraction Topography Utilizing Double-Crystal Arrangement of (+, +) or Non-Parallel (+, -) Setting
JournalJapanese Journal of Applied Physics
AuthorsKohra, KazutakeAuthor
Hashizume, HirooAuthor
Yoshimura, Jun-ichiAuthor
Year1970 (September)Volume9
Issue9
PublisherJapan Society of Applied Physics
DOIdoi:10.1143/jjap.9.1029Search in ResearchGate
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Mindat Ref. ID14978092Long-form Identifiermindat:1:5:14978092:8
GUID0
Full ReferenceKohra, Kazutake, Hashizume, Hiroo, Yoshimura, Jun-ichi (1970) X-Ray Diffraction Topography Utilizing Double-Crystal Arrangement of (+, +) or Non-Parallel (+, -) Setting. Japanese Journal of Applied Physics, 9 (9) 1029-1038 doi:10.1143/jjap.9.1029
Plain TextKohra, Kazutake, Hashizume, Hiroo, Yoshimura, Jun-ichi (1970) X-Ray Diffraction Topography Utilizing Double-Crystal Arrangement of (+, +) or Non-Parallel (+, -) Setting. Japanese Journal of Applied Physics, 9 (9) 1029-1038 doi:10.1143/jjap.9.1029
In(1970, September) Japanese Journal of Applied Physics Vol. 9 (9) Japan Society of Applied Physics

See Also

These are possibly similar items as determined by title/reference text matching only.

Hashizume, Hiroo, Kohra, Kazutake, Yamaguchi, Tomoyori, Kinoshita, Kojiro (1971) APPLICATION OF AN IMAGE ORTHICON CAMERA TUBE TO X‐RAY DIFFRACTION TOPOGRAPHY UTILIZING THE DOUBLE‐CRYSTAL ARRANGEMENT. Applied Physics Letters, 18 (6). 213-214 doi:10.1063/1.1653634
Hashizume, Hiroo, Iida, Atsuo, Kohra, Kazutake (1975) A Multiple Crystal System for High Strain-Sensitivity X-Ray Topography and Its Applications. Japanese Journal of Applied Physics, 14 (10) 1433-1442 doi:10.1143/jjap.14.1433
Kohra, Kazutake, Takano, Yukio (1968) A New Method of X-Ray Diffraction Topography Using Monochromatic Divergent Beams Made by a Curved Crystal. Japanese Journal of Applied Physics, 7 (9) 982-988 doi:10.1143/jjap.7.982
Hashizume, Hiroo, Amemiya, Yoshiyuki, Kohra, Kazutake, Izumi, Takatoshi, Mase, Kiyoshi (1976) Techniques for Time-Resolved X-Ray Diffraction Using a Position Sensitive Counter. Japanese Journal of Applied Physics, 15 (11) 2211-2219 doi:10.1143/jjap.15.2211
Takano, Yukio, Kohra, Kazutake (1974) A Modification for X-Ray Diffraction Topography of Oscillating Method Using Monochromatic Divergent Beams. Japanese Journal of Applied Physics, 13 (9) 1335-1338 doi:10.1143/jjap.13.1335
Kozaki, Shigeru, Hashizume, Hiroo, Kohra, Kazutake (1972) High-Resolution Video Display of X-Ray Topographs with the Divergent Laue Method. Japanese Journal of Applied Physics, 11 (10) 1514-1521 doi:10.1143/jjap.11.1514
Hashizume, Hiroo, Ishida, Hidenobu, Kohra, Kazutake (1971) A Study on Equal-Thickness Fringes in a Silicon Crystal by Means of an X-ray Video Imaging Device. Japanese Journal of Applied Physics, 10 (4) 514-515 doi:10.1143/jjap.10.514
Takano, Yukio, Kohn, Kay, Kikuta, Seishi, Kohra, Kazutake (1970) X-Ray Studies of Dislocation Structures in a Sapphire Crystal. Japanese Journal of Applied Physics, 9 (7) 847-848 doi:10.1143/jjap.9.847
Hashizume, Hiroo, Kohra, Kazutake (1970) Propagation of X-Rays in a Slightly Distorted Silicon Crystal. Journal of the Physical Society of Japan, 29 (3). 805 doi:10.1143/jpsj.29.805
Kikuta, Seishi, Kohra, Kazutake, Sugita, Yoshimitsu (1966) Measurements on Local Variations in Spacing and Orientation of the Lattice Plane of Silicon Single Crystals by X-Ray Double-Crystal Topography. Japanese Journal of Applied Physics, 5 (11) 1047-1055 doi:10.1143/jjap.5.1047
Hashizume, Hiroo, Nakayama, Kan, Matsushita, Tadashi, Kohra, Kazutake (1970) Variation of Bragg-Case Diffraction Curves of X-Rays from a Thin Silicon Crystal with Crystal Thickness. Journal of the Physical Society of Japan, 29 (3). 806 doi:10.1143/jpsj.29.806
 
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