Reference Type | Journal (article/letter/editorial) |
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Title | Effect of Electron-Hole Recombination on the Performance of Bi12SiO20Optical Image Converter |
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Journal | Japanese Journal of Applied Physics |
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Authors | Minemoto, Takumi | Author |
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Toda, Toshihiro | Author |
Year | 1981 (December) | Volume | 20 |
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Issue | 12 |
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Publisher | Japan Society of Applied Physics |
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DOI | doi:10.1143/jjap.20.2373Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 14984755 | Long-form Identifier | mindat:1:5:14984755:3 |
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GUID | 0 |
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Full Reference | Minemoto, Takumi, Toda, Toshihiro (1981) Effect of Electron-Hole Recombination on the Performance of Bi12SiO20Optical Image Converter. Japanese Journal of Applied Physics, 20 (12) 2373-2381 doi:10.1143/jjap.20.2373 |
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Plain Text | Minemoto, Takumi, Toda, Toshihiro (1981) Effect of Electron-Hole Recombination on the Performance of Bi12SiO20Optical Image Converter. Japanese Journal of Applied Physics, 20 (12) 2373-2381 doi:10.1143/jjap.20.2373 |
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In | (1981, December) Japanese Journal of Applied Physics Vol. 20 (12) Japan Society of Applied Physics |
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