| Reference Type | Journal (article/letter/editorial) |
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| Title | Small Angle and Very-Small Angle X-Ray Scattering from Amorphous Pd80Si20before and after Cold Work |
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| Journal | Japanese Journal of Applied Physics |
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| Authors | Suzuki, Carlos Kenichi | Author |
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| Doi, Kenji | Author |
| Kohra, Kazutake | Author |
| Year | 1981 (April) | Volume | 20 |
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| Issue | 4 |
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| Publisher | Japan Society of Applied Physics |
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| DOI | doi:10.1143/jjap.20.l271Search in ResearchGate |
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| Generate Citation Formats |
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| Mindat Ref. ID | 14984951 | Long-form Identifier | mindat:1:5:14984951:9 |
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|
| GUID | 0 |
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| Full Reference | Suzuki, Carlos Kenichi, Doi, Kenji, Kohra, Kazutake (1981) Small Angle and Very-Small Angle X-Ray Scattering from Amorphous Pd80Si20before and after Cold Work. Japanese Journal of Applied Physics, 20 (4) doi:10.1143/jjap.20.l271 |
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| Plain Text | Suzuki, Carlos Kenichi, Doi, Kenji, Kohra, Kazutake (1981) Small Angle and Very-Small Angle X-Ray Scattering from Amorphous Pd80Si20before and after Cold Work. Japanese Journal of Applied Physics, 20 (4) doi:10.1143/jjap.20.l271 |
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| In | (1981, April) Japanese Journal of Applied Physics Vol. 20 (4) Japan Society of Applied Physics |
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