Reference Type | Journal (article/letter/editorial) |
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Title | Anomalous Residual-Stress in Pulsed-Laser-Annealed Silicon-on-Sapphire Revealed by Raman Scattering |
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Journal | Japanese Journal of Applied Physics |
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Authors | Yamazaki, Ken-ichi | Author |
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Yamada, Masayoshi | Author |
Yamamoto, Keiichi | Author |
Abe, Kenji | Author |
Year | 1981 (April) | Volume | 20 |
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Issue | 4 |
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Publisher | Japan Society of Applied Physics |
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DOI | doi:10.1143/jjap.20.l299Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 14984959 | Long-form Identifier | mindat:1:5:14984959:5 |
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GUID | 0 |
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Full Reference | Yamazaki, Ken-ichi, Yamada, Masayoshi, Yamamoto, Keiichi, Abe, Kenji (1981) Anomalous Residual-Stress in Pulsed-Laser-Annealed Silicon-on-Sapphire Revealed by Raman Scattering. Japanese Journal of Applied Physics, 20 (4) doi:10.1143/jjap.20.l299 |
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Plain Text | Yamazaki, Ken-ichi, Yamada, Masayoshi, Yamamoto, Keiichi, Abe, Kenji (1981) Anomalous Residual-Stress in Pulsed-Laser-Annealed Silicon-on-Sapphire Revealed by Raman Scattering. Japanese Journal of Applied Physics, 20 (4) doi:10.1143/jjap.20.l299 |
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In | (1981, April) Japanese Journal of Applied Physics Vol. 20 (4) Japan Society of Applied Physics |
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