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Yamamoto, Shigeyuki (1981) A Versatile Photostimulated Exoelectron Emission Microscope as Applied to Observing Mechanical Damage on Aluminum Surfaces. Japanese Journal of Applied Physics, 20 (5) 971-978 doi:10.1143/jjap.20.971

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Reference TypeJournal (article/letter/editorial)
TitleA Versatile Photostimulated Exoelectron Emission Microscope as Applied to Observing Mechanical Damage on Aluminum Surfaces
JournalJapanese Journal of Applied Physics
AuthorsYamamoto, ShigeyukiAuthor
Year1981 (May)Volume20
Issue5
PublisherJapan Society of Applied Physics
DOIdoi:10.1143/jjap.20.971Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID14984992Long-form Identifiermindat:1:5:14984992:2
GUID0
Full ReferenceYamamoto, Shigeyuki (1981) A Versatile Photostimulated Exoelectron Emission Microscope as Applied to Observing Mechanical Damage on Aluminum Surfaces. Japanese Journal of Applied Physics, 20 (5) 971-978 doi:10.1143/jjap.20.971
Plain TextYamamoto, Shigeyuki (1981) A Versatile Photostimulated Exoelectron Emission Microscope as Applied to Observing Mechanical Damage on Aluminum Surfaces. Japanese Journal of Applied Physics, 20 (5) 971-978 doi:10.1143/jjap.20.971
In(1981, May) Japanese Journal of Applied Physics Vol. 20 (5) Japan Society of Applied Physics

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Yamamoto, Shigeyuki (1977) Measurement of Surface Fatigue Damage by Using Photostimulated Exoelectron Emission. Japanese Journal of Applied Physics, 16 (12) 2157-2163 doi:10.1143/jjap.16.2157
Yamamoto, Shigeyuki (1976) Photostimulated Exoelectron Emission during and after Tensile Deformation from Thin Films Deposited on Copper Substrates. Japanese Journal of Applied Physics, 15 (8) 1573-1574 doi:10.1143/jjap.15.1573
Shigekawa, Hidemi, Hyodo, Shin-ichi (1982) Storage Effect in Photostimulated Exoelectron Emission from Scratched Aluminum. Japanese Journal of Applied Physics, 21. 1278-1282 doi:10.1143/jjap.21.1278
Yamamoto, Shigeyuki, Yokogawa, Hiroshi, Hashimoto, Hiroshi (1985) Versatile photostimulated exoelectron microscope with measurement capabilities in SEM mode. Review of Scientific Instruments, 56 (10). 1934-1936 doi:10.1063/1.1138448
Shigekawa, Hidemi, Fujiwara, Yuichiro, Hyodo, Shin-ichi (1984) A Note on Electron Transfer to Exoelectron Emission Sources from Scratched Aluminum. Japanese Journal of Applied Physics, 23. 1146 doi:10.1143/jjap.23.1146
Kamada, Masao, Furukawa, Katsuki, Tsutsumi, Kenjiro (1981) Thermally Stimulated Exoelectron Emission in KCl: Tl, KCl: Cu and Undoped KCl. Japanese Journal of Applied Physics, 20 (1) 71-77 doi:10.1143/jjap.20.71
Shiota, Tadashi, Kibi, Sinji, Yamamoto, Ryo, Tagawa, Masahito, Ohmae, Nobuo, Umeno, Masataka (2000) Effect of Low-Energy Ion Bombardment upon Field-Stimulated Exoelectron Emission from Tungsten Surfaces. Japanese Journal of Applied Physics, 39. doi:10.1143/jjap.39.l110
Yoshida, Kiyohide (1981) Adsorption of CO on Iron Single Crystal Surfaces. Japanese Journal of Applied Physics, 20 (5) 823-833 doi:10.1143/jjap.20.823
Shigekawa, Hidemi, Hyodo, Shin-ichi (1983) Intensity vs Time Profiles of Photostimulated Exoelctron Emission from Scratched Aluminum. Japanese Journal of Applied Physics, 22. 1493-1495 doi:10.1143/jjap.22.1493
Sawada, Renshi, Karaki, Toshiroh, Watanabe, Junji (1981) Mechanical Damage Gettering Effect in Si. Japanese Journal of Applied Physics, 20 (11) 2097-2104 doi:10.1143/jjap.20.2097
Kingetsu, Toshiki, Yamamoto, Masahiko, Nenno, Soji (1981) Field-Ion Microscope Observation of Thermal Faceting in Ni4Mo Emitter. Japanese Journal of Applied Physics, 20 (11) 2037-2046 doi:10.1143/jjap.20.2037
 
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