| Reference Type | Journal (article/letter/editorial) |
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| Title | Hall-Effect Measurement on Polycrystalline SnO2Thin Films |
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| Journal | Japanese Journal of Applied Physics |
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| Authors | Fujisawa, Akira | Author |
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| Nishino, Taneo | Author |
| Hamakawa, Yoshihiro | Author |
| Year | 1988 (April 20) | Volume | 27 |
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| Publisher | Japan Society of Applied Physics |
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| DOI | doi:10.1143/jjap.27.552Search in ResearchGate |
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| Generate Citation Formats |
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| Mindat Ref. ID | 14992012 | Long-form Identifier | mindat:1:5:14992012:6 |
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|
| GUID | 0 |
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| Full Reference | Fujisawa, Akira, Nishino, Taneo, Hamakawa, Yoshihiro (1988) Hall-Effect Measurement on Polycrystalline SnO2Thin Films. Japanese Journal of Applied Physics, 27. 552-555 doi:10.1143/jjap.27.552 |
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| Plain Text | Fujisawa, Akira, Nishino, Taneo, Hamakawa, Yoshihiro (1988) Hall-Effect Measurement on Polycrystalline SnO2Thin Films. Japanese Journal of Applied Physics, 27. 552-555 doi:10.1143/jjap.27.552 |
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| In | (1988) Japanese Journal of Applied Physics Vol. 27. Japan Society of Applied Physics |
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