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Matsui, Yoshio, Maeda, Hiroshi, Tanaka, Yoshiaki, Horiuchi, Shigeo (1989) Profile-Imaging of Wavy Cleavage Surface of Bi2Sr2CaCu2Oyby High-Resolution Transmission Electron Microscopy. Japanese Journal of Applied Physics, 28. doi:10.1143/jjap.28.l946

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Reference TypeJournal (article/letter/editorial)
TitleProfile-Imaging of Wavy Cleavage Surface of Bi2Sr2CaCu2Oyby High-Resolution Transmission Electron Microscopy
JournalJapanese Journal of Applied Physics
AuthorsMatsui, YoshioAuthor
Maeda, HiroshiAuthor
Tanaka, YoshiakiAuthor
Horiuchi, ShigeoAuthor
Year1989 (June 20)Volume28
PublisherJapan Society of Applied Physics
DOIdoi:10.1143/jjap.28.l946Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID14994150Long-form Identifiermindat:1:5:14994150:3
GUID0
Full ReferenceMatsui, Yoshio, Maeda, Hiroshi, Tanaka, Yoshiaki, Horiuchi, Shigeo (1989) Profile-Imaging of Wavy Cleavage Surface of Bi2Sr2CaCu2Oyby High-Resolution Transmission Electron Microscopy. Japanese Journal of Applied Physics, 28. doi:10.1143/jjap.28.l946
Plain TextMatsui, Yoshio, Maeda, Hiroshi, Tanaka, Yoshiaki, Horiuchi, Shigeo (1989) Profile-Imaging of Wavy Cleavage Surface of Bi2Sr2CaCu2Oyby High-Resolution Transmission Electron Microscopy. Japanese Journal of Applied Physics, 28. doi:10.1143/jjap.28.l946
In(1989) Japanese Journal of Applied Physics Vol. 28. Japan Society of Applied Physics

See Also

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Matsui, Yoshio, Horiuchi, Shigeo, Sawa, Hiroshi, Obara, Kazuhiko, Akimitsu, Jun (1989) Planar Defects in the New Superconducting Oxide (Eu1-xCex)2(Ba1-yEuy)2Cu3OzObserved by High-Resolution Transmission Electron Microscopy. Japanese Journal of Applied Physics, 28. doi:10.1143/jjap.28.l1555
Matsui, Yoshio, Maeda, Hiroshi, Tanaka, Yoshiaki, Horiuchi, Shigeo (1988) High-Resolution Electron Microscopy of Modulated Structure in the New High-TcSuperconductors of the Bi-Sr-Ca-Cu-O System. Japanese Journal of Applied Physics, 27. doi:10.1143/jjap.27.l361
Matsui, Yoshio, Maeda, Hiroshi, Tanaka, Yoshiaki, Horiuchi, Shigeo (1988) Possible Model of the Modulated Structure in High-TcSuperconductor in a Bi-Sr-Ca-Cu-O System Revealed by High-Resolution Electron Microscopy. Japanese Journal of Applied Physics, 27. doi:10.1143/jjap.27.l372
Matsui, Yoshio, Maeda, Hiroshi, Tanaka, Yoshiaki, Takayama-Muromachi, Eiji, Takekawa, Shunji, Horiuchi, Shigeo (1988) Twins and Intergrowth Defects in High-TcBi-Sr-Ca-Cu-O Superconductor Examined by High-Resolution Electron Microscopy. Japanese Journal of Applied Physics, 27. doi:10.1143/jjap.27.l827
Horiuchi, Shigeo, Shoda, Kaoru, Iwatsuki, Masashi, Harada, Yoshiyasu, Matsui, Yoshio (1989) Low-Temperature Electron Microscopy of a Bi2(Sr, Ca)3Cu2OxSuperconductor. Japanese Journal of Applied Physics, 28. doi:10.1143/jjap.28.l386
Matsui, Yoshio, Kishio, Kohji, Tomioka, Yasuhide, Hasegawa, Tetsuya, Ikeda, Shozo (1989) High-Resolution Transmission Electron Microscopy of Commensurate Modulation in Bi2Sr2CoOy. Japanese Journal of Applied Physics, 28. doi:10.1143/jjap.28.l1991
Matsui, Yoshio, Takekawa, Shunji, Nozaki, Hiroshi, Umezono, Akihiro (1989) High-Resolution Transmission Electron Microscopy of Long-Period Structures of Various Phases in a Bi-Sr-Cu-O System. Japanese Journal of Applied Physics, 28. doi:10.1143/jjap.28.l602
Matsui, Yoshio, Takayama-Muromachi, Eiji, Ono, Akira, Horiuchi, Shigeo, Kato, Katsuo (1987) High Resolution Transmission Electron Microscopy of Defects in HighTcSuperconductor Ba2YCu3Oy. Japanese Journal of Applied Physics, 26. doi:10.1143/jjap.26.l777
Horiuchi, Shigeo, Shoda, Kaoru, Nozaki, Hiroshi, Onoda, Yoshito, Matsui, Yoshio (1989) Tc=113 K Bi-Based Superconductor Prepared by Doping Fluorine. Japanese Journal of Applied Physics, 28. doi:10.1143/jjap.28.l621
Horiuchi, Shigeo, Maeda, Hiroshi, Tanaka, Yoshiaki, Matsui, Yoshio (1988) Structure Analysis of the Bi2(Sr, Ca)3Cu2O8.2Superconducting Crystal Based on the Computer Simulation of HRTEM Images. Japanese Journal of Applied Physics, 27. doi:10.1143/jjap.27.l1172
Horiuchi, Shigeo, Matsui, Yoshio (1992) Imaging Conditions for Resolving Oxygen Atoms in ZrO2by an Ultra-High-Resolution High-Voltage Electron Microscope. Japanese Journal of Applied Physics, 31. doi:10.1143/jjap.31.l283
 
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