Urushido, Tatsuhiro, Yoshida, Harumasa, Miyake, Hideto, Hiramatsu, Kazumasa (2002) Influence of Ge and Si on Reactive Ion Etching of GaN in Cl2 Plasma. Japanese Journal of Applied Physics, 41. doi:10.1143/jjap.41.l31
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Influence of Ge and Si on Reactive Ion Etching of GaN in Cl2 Plasma | ||
Journal | Japanese Journal of Applied Physics | ||
Authors | Urushido, Tatsuhiro | Author | |
Yoshida, Harumasa | Author | ||
Miyake, Hideto | Author | ||
Hiramatsu, Kazumasa | Author | ||
Year | 2002 (January 15) | Volume | 41 |
Publisher | Japan Society of Applied Physics | ||
DOI | doi:10.1143/jjap.41.l31Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 15019382 | Long-form Identifier | mindat:1:5:15019382:3 |
GUID | 0 | ||
Full Reference | Urushido, Tatsuhiro, Yoshida, Harumasa, Miyake, Hideto, Hiramatsu, Kazumasa (2002) Influence of Ge and Si on Reactive Ion Etching of GaN in Cl2 Plasma. Japanese Journal of Applied Physics, 41. doi:10.1143/jjap.41.l31 | ||
Plain Text | Urushido, Tatsuhiro, Yoshida, Harumasa, Miyake, Hideto, Hiramatsu, Kazumasa (2002) Influence of Ge and Si on Reactive Ion Etching of GaN in Cl2 Plasma. Japanese Journal of Applied Physics, 41. doi:10.1143/jjap.41.l31 | ||
In | (2002) Japanese Journal of Applied Physics Vol. 41. Japan Society of Applied Physics |
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