Iyechika, Yasushi, Shimizu, Masaya, Maeda, Takayoshi, Miyake, Hideto, Hiramatsu, Kazumasa (2003) X-Ray Analysis of Twist and Tilt of GaN Prepared by Facet-Controlled Epitaxial Lateral Overgrowth (FACELO) Japanese Journal of Applied Physics, 42. doi:10.1143/jjap.42.l732
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | X-Ray Analysis of Twist and Tilt of GaN Prepared by Facet-Controlled Epitaxial Lateral Overgrowth (FACELO) | ||
Journal | Japanese Journal of Applied Physics | ||
Authors | Iyechika, Yasushi | Author | |
Shimizu, Masaya | Author | ||
Maeda, Takayoshi | Author | ||
Miyake, Hideto | Author | ||
Hiramatsu, Kazumasa | Author | ||
Year | 2003 (July 1) | Volume | 42 |
Publisher | Japan Society of Applied Physics | ||
DOI | doi:10.1143/jjap.42.l732Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 15021702 | Long-form Identifier | mindat:1:5:15021702:4 |
GUID | 0 | ||
Full Reference | Iyechika, Yasushi, Shimizu, Masaya, Maeda, Takayoshi, Miyake, Hideto, Hiramatsu, Kazumasa (2003) X-Ray Analysis of Twist and Tilt of GaN Prepared by Facet-Controlled Epitaxial Lateral Overgrowth (FACELO) Japanese Journal of Applied Physics, 42. doi:10.1143/jjap.42.l732 | ||
Plain Text | Iyechika, Yasushi, Shimizu, Masaya, Maeda, Takayoshi, Miyake, Hideto, Hiramatsu, Kazumasa (2003) X-Ray Analysis of Twist and Tilt of GaN Prepared by Facet-Controlled Epitaxial Lateral Overgrowth (FACELO) Japanese Journal of Applied Physics, 42. doi:10.1143/jjap.42.l732 | ||
In | (2003) Japanese Journal of Applied Physics Vol. 42. Japan Society of Applied Physics |
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