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Iyechika, Yasushi, Shimizu, Masaya, Maeda, Takayoshi, Miyake, Hideto, Hiramatsu, Kazumasa (2003) X-Ray Analysis of Twist and Tilt of GaN Prepared by Facet-Controlled Epitaxial Lateral Overgrowth (FACELO) Japanese Journal of Applied Physics, 42. doi:10.1143/jjap.42.l732

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Reference TypeJournal (article/letter/editorial)
TitleX-Ray Analysis of Twist and Tilt of GaN Prepared by Facet-Controlled Epitaxial Lateral Overgrowth (FACELO)
JournalJapanese Journal of Applied Physics
AuthorsIyechika, YasushiAuthor
Shimizu, MasayaAuthor
Maeda, TakayoshiAuthor
Miyake, HidetoAuthor
Hiramatsu, KazumasaAuthor
Year2003 (July 1)Volume42
PublisherJapan Society of Applied Physics
DOIdoi:10.1143/jjap.42.l732Search in ResearchGate
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Mindat Ref. ID15021702Long-form Identifiermindat:1:5:15021702:4
GUID0
Full ReferenceIyechika, Yasushi, Shimizu, Masaya, Maeda, Takayoshi, Miyake, Hideto, Hiramatsu, Kazumasa (2003) X-Ray Analysis of Twist and Tilt of GaN Prepared by Facet-Controlled Epitaxial Lateral Overgrowth (FACELO) Japanese Journal of Applied Physics, 42. doi:10.1143/jjap.42.l732
Plain TextIyechika, Yasushi, Shimizu, Masaya, Maeda, Takayoshi, Miyake, Hideto, Hiramatsu, Kazumasa (2003) X-Ray Analysis of Twist and Tilt of GaN Prepared by Facet-Controlled Epitaxial Lateral Overgrowth (FACELO) Japanese Journal of Applied Physics, 42. doi:10.1143/jjap.42.l732
In(2003) Japanese Journal of Applied Physics Vol. 42. Japan Society of Applied Physics


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