Fukuda, Kazunori, Tomita, Naohiro, Hayashi, Kazuki, Tsusaka, Yoshiyuki, Kagoshima, Yasushi, Matsui, Junji, Ogura, Atsushi (2006) Two-Dimensional Anisotropic Lattice Deformation Observed in a Commercially Available Strained-Si Wafer. Japanese Journal of Applied Physics, 45 (11) 8542-8548 doi:10.1143/jjap.45.8542
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Two-Dimensional Anisotropic Lattice Deformation Observed in a Commercially Available Strained-Si Wafer | ||
| Journal | Japanese Journal of Applied Physics | ||
| Authors | Fukuda, Kazunori | Author | |
| Tomita, Naohiro | Author | ||
| Hayashi, Kazuki | Author | ||
| Tsusaka, Yoshiyuki | Author | ||
| Kagoshima, Yasushi | Author | ||
| Matsui, Junji | Author | ||
| Ogura, Atsushi | Author | ||
| Year | 2006 (November 8) | Volume | 45 |
| Issue | 11 | ||
| Publisher | Japan Society of Applied Physics | ||
| DOI | doi:10.1143/jjap.45.8542Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 15027207 | Long-form Identifier | mindat:1:5:15027207:8 |
| GUID | 0 | ||
| Full Reference | Fukuda, Kazunori, Tomita, Naohiro, Hayashi, Kazuki, Tsusaka, Yoshiyuki, Kagoshima, Yasushi, Matsui, Junji, Ogura, Atsushi (2006) Two-Dimensional Anisotropic Lattice Deformation Observed in a Commercially Available Strained-Si Wafer. Japanese Journal of Applied Physics, 45 (11) 8542-8548 doi:10.1143/jjap.45.8542 | ||
| Plain Text | Fukuda, Kazunori, Tomita, Naohiro, Hayashi, Kazuki, Tsusaka, Yoshiyuki, Kagoshima, Yasushi, Matsui, Junji, Ogura, Atsushi (2006) Two-Dimensional Anisotropic Lattice Deformation Observed in a Commercially Available Strained-Si Wafer. Japanese Journal of Applied Physics, 45 (11) 8542-8548 doi:10.1143/jjap.45.8542 | ||
| In | (2006, November) Japanese Journal of Applied Physics Vol. 45 (11) Japan Society of Applied Physics | ||
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