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Kin, Nobuhiro, Takai, Kazuaki, Honda, Koichiro (2008) High Speed Pulse Measurement of Micro Ferroelectric Capacitors Using a Multi-Probe Atomic Force Microscope. Japanese Journal of Applied Physics, 47 (6) 4638-4642 doi:10.1143/jjap.47.4638

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Reference TypeJournal (article/letter/editorial)
TitleHigh Speed Pulse Measurement of Micro Ferroelectric Capacitors Using a Multi-Probe Atomic Force Microscope
JournalJapanese Journal of Applied Physics
AuthorsKin, NobuhiroAuthor
Takai, KazuakiAuthor
Honda, KoichiroAuthor
Year2008 (June 13)Volume47
Issue6
PublisherJapan Society of Applied Physics
DOIdoi:10.1143/jjap.47.4638Search in ResearchGate
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Mindat Ref. ID15032209Long-form Identifiermindat:1:5:15032209:4
GUID0
Full ReferenceKin, Nobuhiro, Takai, Kazuaki, Honda, Koichiro (2008) High Speed Pulse Measurement of Micro Ferroelectric Capacitors Using a Multi-Probe Atomic Force Microscope. Japanese Journal of Applied Physics, 47 (6) 4638-4642 doi:10.1143/jjap.47.4638
Plain TextKin, Nobuhiro, Takai, Kazuaki, Honda, Koichiro (2008) High Speed Pulse Measurement of Micro Ferroelectric Capacitors Using a Multi-Probe Atomic Force Microscope. Japanese Journal of Applied Physics, 47 (6) 4638-4642 doi:10.1143/jjap.47.4638
In(2008, June) Japanese Journal of Applied Physics Vol. 47 (6) Japan Society of Applied Physics

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