Watch the Dallas Symposium LIVE, and fundraiser auction
Ticket proceeds support mindat.org! - click here...
Log InRegister
Quick Links : The Mindat ManualThe Rock H. Currier Digital LibraryMindat Newsletter [Free Download]
Home PageAbout MindatThe Mindat ManualHistory of MindatCopyright StatusWho We AreContact UsAdvertise on Mindat
Donate to MindatCorporate SponsorshipSponsor a PageSponsored PagesMindat AdvertisersAdvertise on Mindat
Learning CenterWhat is a mineral?The most common minerals on earthInformation for EducatorsMindat ArticlesThe ElementsThe Rock H. Currier Digital LibraryGeologic Time
Minerals by PropertiesMinerals by ChemistryAdvanced Locality SearchRandom MineralRandom LocalitySearch by minIDLocalities Near MeSearch ArticlesSearch GlossaryMore Search Options
Search For:
Mineral Name:
Locality Name:
Keyword(s):
 
The Mindat ManualAdd a New PhotoRate PhotosLocality Edit ReportCoordinate Completion ReportAdd Glossary Item
Mining CompaniesStatisticsUsersMineral MuseumsClubs & OrganizationsMineral Shows & EventsThe Mindat DirectoryDevice SettingsThe Mineral Quiz
Photo SearchPhoto GalleriesSearch by ColorNew Photos TodayNew Photos YesterdayMembers' Photo GalleriesPast Photo of the Day GalleryPhotography

Kin, Nobuhiro, Honda, Koichiro (2006) Analysis of Ferroelectric Microcapacitors at Low and High Temperatures Using a Scanning Probe Microscope. Japanese Journal of Applied Physics, 45 (11) 8748-8750 doi:10.1143/jjap.45.8748

Advanced
   -   Only viewable:
Reference TypeJournal (article/letter/editorial)
TitleAnalysis of Ferroelectric Microcapacitors at Low and High Temperatures Using a Scanning Probe Microscope
JournalJapanese Journal of Applied Physics
AuthorsKin, NobuhiroAuthor
Honda, KoichiroAuthor
Year2006 (November 8)Volume45
Issue11
PublisherJapan Society of Applied Physics
DOIdoi:10.1143/jjap.45.8748Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID15027250Long-form Identifiermindat:1:5:15027250:4
GUID0
Full ReferenceKin, Nobuhiro, Honda, Koichiro (2006) Analysis of Ferroelectric Microcapacitors at Low and High Temperatures Using a Scanning Probe Microscope. Japanese Journal of Applied Physics, 45 (11) 8748-8750 doi:10.1143/jjap.45.8748
Plain TextKin, Nobuhiro, Honda, Koichiro (2006) Analysis of Ferroelectric Microcapacitors at Low and High Temperatures Using a Scanning Probe Microscope. Japanese Journal of Applied Physics, 45 (11) 8748-8750 doi:10.1143/jjap.45.8748
In(2006, November) Japanese Journal of Applied Physics Vol. 45 (11) Japan Society of Applied Physics

See Also

These are possibly similar items as determined by title/reference text matching only.

Kin, Nobuhiro, Takai, Kazuaki, Honda, Koichiro (2008) High Speed Pulse Measurement of Micro Ferroelectric Capacitors Using a Multi-Probe Atomic Force Microscope. Japanese Journal of Applied Physics, 47 (6) 4638-4642 doi:10.1143/jjap.47.4638
Okamura, Soichiro, Iwase, Takuma, Takeda, Hiroaki, Nishida, Takashi, Shiosaki, Tadashi (2005) Estimation of Parasitic Capacitance in Measurement of Hysteresis Properties of Ferroelectric Microcapacitors Using Scanning Probe Microscope. Japanese Journal of Applied Physics, 44 (11) 8062-8065 doi:10.1143/jjap.44.8062
Takahashi, Hirokazu, Onoe, Astushi, Ono, Takahito, Cho, Yasuo, Esashi, Masayoshi (2006) High-Density Ferroelectric Recording Using Diamond Probe by Scanning Nonlinear Dielectric Microscopy. Japanese Journal of Applied Physics, 45 (3) 1530-1533 doi:10.1143/jjap.45.1530
Yasutake, Masatoshi, Watanabe, Kazutoshi, Wakiyama, Sigeru, Yamaoka, Takehiro (2006) Critical Dimension Measurement Using New Scanning Mode and Aligned Carbon Nanotube Scanning Probe Microscope Tip. Japanese Journal of Applied Physics, 45 (3) 1970-1973 doi:10.1143/jjap.45.1970
Nakatani, Noriyuki (1973) Ferroelectric Domain Structure of Tri-Glycine Sulfate Observed Using a Scanning Electron Microscope. Japanese Journal of Applied Physics, 12 (11) 1723-1728 doi:10.1143/jjap.12.1723
Kobayashi, Atsushi, Ohta, Jitsuo, Fujioka, Hiroshi (2006) Characteristics of InGaN with High In Concentrations Grown on ZnO at Low Temperatures. Japanese Journal of Applied Physics, 45. doi:10.1143/jjap.45.l611
Niitsuma, Jun-ichi, Yuan, Xiao-li, Koizumi, Satoshi, Sekiguchi, Takashi (2006) Nanoprocessing of Diamond Using a Variable Pressure Scanning Electron Microscope. Japanese Journal of Applied Physics, 45. doi:10.1143/jjap.45.l71
Yoshimoto, Masahiro (2000) Scanning Photoluminescence Microscope with Sub-micron Resolution and High Optical Throughput at a Low Temperature. Japanese Journal of Applied Physics, 39. 6105-6106 doi:10.1143/jjap.39.6105
Cho, Yasuo, Atsumi, Shigeyuki, Nakamura, Kiyoshi (1997) Scanning Nonlinear Dielectric Microscope Using a Lumped Constant Resonator Probe and Its Application to Investigation of Ferroelectric Polarization Distributions. Japanese Journal of Applied Physics, 36. 3152-3156 doi:10.1143/jjap.36.3152
Sudoh, Koichi, Iwasaki, Hiroshi (2000) Nanopit Formation and Manipulation of Steps on Si(001) at High Temperatures with a Scanning Tunneling Microscope. Japanese Journal of Applied Physics, 39. 4621-4623 doi:10.1143/jjap.39.4621
Nakatani, Noriyuki (1973) Observation of Ferroelectric Domain Structures of Tri-Glycine Sulfate Using a Scanning Electron Microscope. Japanese Journal of Applied Physics, 12 (2) 313 doi:10.1143/jjap.12.313
 
and/or  
Mindat.org is an outreach project of the Hudson Institute of Mineralogy, a 501(c)(3) not-for-profit organization.
Copyright © mindat.org and the Hudson Institute of Mineralogy 1993-2025, except where stated. Most political location boundaries are Β© OpenStreetMap contributors. Mindat.org relies on the contributions of thousands of members and supporters. Founded in 2000 by Jolyon Ralph.
To cite: Ralph, J., Von Bargen, D., Martynov, P., Zhang, J., Que, X., Prabhu, A., Morrison, S. M., Li, W., Chen, W., & Ma, X. (2025). Mindat.org: The open access mineralogy database to accelerate data-intensive geoscience research. American Mineralogist, 110(6), 833–844. doi:10.2138/am-2024-9486.
Privacy Policy - Terms & Conditions - Contact Us / DMCA issues - Report a bug/vulnerability Current server date and time: August 21, 2025 01:51:23
Go to top of page