Xianfeng, Zhang, Kobayashi, Tsuyoshi, Kurokawa, Yasuyoshi, Tashiro, Yoshiyuki, Ohtsuka, Masahiro, Yamada, Tomoyuki, Yamada, Akira (2011) Comparison of Interface Characterization between Ag(In,Ga)Se2and Cu(In,Ga)Se2Solar Cells by High-Angle-Annular Dark-Field Scanning Transmission Electron Microscopy. Japanese Journal of Applied Physics, 50 (12) 126603 doi:10.7567/jjap.50.126603
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Comparison of Interface Characterization between Ag(In,Ga)Se2and Cu(In,Ga)Se2Solar Cells by High-Angle-Annular Dark-Field Scanning Transmission Electron Microscopy | ||
Journal | Japanese Journal of Applied Physics | ||
Authors | Xianfeng, Zhang | Author | |
Kobayashi, Tsuyoshi | Author | ||
Kurokawa, Yasuyoshi | Author | ||
Tashiro, Yoshiyuki | Author | ||
Ohtsuka, Masahiro | Author | ||
Yamada, Tomoyuki | Author | ||
Yamada, Akira | Author | ||
Year | 2011 (December 1) | Volume | 50 |
Issue | 12 | ||
Publisher | Japan Society of Applied Physics | ||
DOI | doi:10.7567/jjap.50.126603Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 15037306 | Long-form Identifier | mindat:1:5:15037306:5 |
GUID | 0 | ||
Full Reference | Xianfeng, Zhang, Kobayashi, Tsuyoshi, Kurokawa, Yasuyoshi, Tashiro, Yoshiyuki, Ohtsuka, Masahiro, Yamada, Tomoyuki, Yamada, Akira (2011) Comparison of Interface Characterization between Ag(In,Ga)Se2and Cu(In,Ga)Se2Solar Cells by High-Angle-Annular Dark-Field Scanning Transmission Electron Microscopy. Japanese Journal of Applied Physics, 50 (12) 126603 doi:10.7567/jjap.50.126603 | ||
Plain Text | Xianfeng, Zhang, Kobayashi, Tsuyoshi, Kurokawa, Yasuyoshi, Tashiro, Yoshiyuki, Ohtsuka, Masahiro, Yamada, Tomoyuki, Yamada, Akira (2011) Comparison of Interface Characterization between Ag(In,Ga)Se2and Cu(In,Ga)Se2Solar Cells by High-Angle-Annular Dark-Field Scanning Transmission Electron Microscopy. Japanese Journal of Applied Physics, 50 (12) 126603 doi:10.7567/jjap.50.126603 | ||
In | (2011, December) Japanese Journal of Applied Physics Vol. 50 (12) Japan Society of Applied Physics |
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