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Buragohain, Pratyush, Lu, Haidong, Richter, Claudia, Schenk, Tony, Kariuki, Pamenas, Glinsek, Sebastjan, Funakubo, Hiroshi, Íñiguez, Jorge, Defay, Emmanuel, Schroeder, Uwe, Gruverman, Alexei (2022) Quantification of the Electromechanical Measurements by Piezoresponse Force Microscopy. Advanced Materials, 34 (47) 2206237 doi:10.1002/adma.202206237

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Reference TypeJournal (article/letter/editorial)
TitleQuantification of the Electromechanical Measurements by Piezoresponse Force Microscopy
JournalAdvanced Materials
AuthorsBuragohain, PratyushAuthor
Lu, HaidongAuthor
Richter, ClaudiaAuthor
Schenk, TonyAuthor
Kariuki, PamenasAuthor
Glinsek, SebastjanAuthor
Funakubo, HiroshiAuthor
Íñiguez, JorgeAuthor
Defay, EmmanuelAuthor
Schroeder, UweAuthor
Gruverman, AlexeiAuthor
Year2022 (November)Volume34
Issue47
PublisherWiley
DOIdoi:10.1002/adma.202206237Search in ResearchGate
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Mindat Ref. ID15518497Long-form Identifiermindat:1:5:15518497:0
GUID0
Full ReferenceBuragohain, Pratyush, Lu, Haidong, Richter, Claudia, Schenk, Tony, Kariuki, Pamenas, Glinsek, Sebastjan, Funakubo, Hiroshi, Íñiguez, Jorge, Defay, Emmanuel, Schroeder, Uwe, Gruverman, Alexei (2022) Quantification of the Electromechanical Measurements by Piezoresponse Force Microscopy. Advanced Materials, 34 (47) 2206237 doi:10.1002/adma.202206237
Plain TextBuragohain, Pratyush, Lu, Haidong, Richter, Claudia, Schenk, Tony, Kariuki, Pamenas, Glinsek, Sebastjan, Funakubo, Hiroshi, Íñiguez, Jorge, Defay, Emmanuel, Schroeder, Uwe, Gruverman, Alexei (2022) Quantification of the Electromechanical Measurements by Piezoresponse Force Microscopy. Advanced Materials, 34 (47) 2206237 doi:10.1002/adma.202206237
In(2022, November) Advanced Materials Vol. 34 (47) Wiley

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