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Goulding, F. S., Landis, D. A. (1982) Signal Processing for Semiconductor Detectors. IEEE Transactions on Nuclear Science, 29 (3) 1125-1141 doi:10.1109/tns.1982.4336332

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Reference TypeJournal (article/letter/editorial)
TitleSignal Processing for Semiconductor Detectors
JournalIEEE Transactions on Nuclear Science
AuthorsGoulding, F. S.Author
Landis, D. A.Author
Year1982Volume29
Issue3
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
DOIdoi:10.1109/tns.1982.4336332Search in ResearchGate
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Mindat Ref. ID15567908Long-form Identifiermindat:1:5:15567908:7
GUID0
Full ReferenceGoulding, F. S., Landis, D. A. (1982) Signal Processing for Semiconductor Detectors. IEEE Transactions on Nuclear Science, 29 (3) 1125-1141 doi:10.1109/tns.1982.4336332
Plain TextGoulding, F. S., Landis, D. A. (1982) Signal Processing for Semiconductor Detectors. IEEE Transactions on Nuclear Science, 29 (3) 1125-1141 doi:10.1109/tns.1982.4336332
In(1982, June) IEEE Transactions on Nuclear Science Vol. 29 (3) Institute of Electrical and Electronics Engineers (IEEE)

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Jared, R. C., Landis, D. A., Goulding, F. S. (1982) Analog Signal Processing for the Time Projection Chamber. IEEE Transactions on Nuclear Science, 29 (1) 57-61 doi:10.1109/tns.1982.4335793
Landis, D. A., Adachi, R. S., Madden, N. W., Goulding, F. S. (1982) Low Noise Preamplifiers/Amplifiers for the Time Projection Chamber. IEEE Transactions on Nuclear Science, 29 (1) 573-577 doi:10.1109/tns.1982.4335911
Landis, D. A., Cork, C. P., Madden, N. W., Goulding, F. S. (1982) Transistor Reset Preamplifier for High Rate High Resolution Spectroscopy. IEEE Transactions on Nuclear Science, 29 (1) 619-624 doi:10.1109/tns.1982.4335922
Goulding, F. S., Landis, D. A., Luke, P. N., Madden, N. W., Malone, D. F., Pehl, R. H., Smith, A. R. (1984) Semiconductor Detectors and Double Beta Decay. IEEE Transactions on Nuclear Science, 31 (1) 285-299 doi:10.1109/tns.1984.4333263
Goulding, F. S. (1978) Semiconductor Detectors - An Introduction. IEEE Transactions on Nuclear Science, 25 (2) 916-920 doi:10.1109/tns.1978.4329435
Goulding, F. S., Landis, D. A. (1978) Some Electronic Aspects of Energy Measurements with Solid-State Detectors. IEEE Transactions on Nuclear Science, 25 (2) 896-901 doi:10.1109/tns.1978.4329432
Spieler, Helmuth (1982) Fast Timing Methods for Semiconductor Detectors. IEEE Transactions on Nuclear Science, 29 (3) 1142-1158 doi:10.1109/tns.1982.4336333
Glasow, P. A. (1982) Industrial Applications of Semiconductor Detectors. IEEE Transactions on Nuclear Science, 29 (3) 1159-1171 doi:10.1109/tns.1982.4336334
Goulding, F. S., Landis, D. A., Cerny, J., Pehl, R. H. (1966) An Improved Particle Identifier for Studies of Low-Yield Nuclear Reactions. IEEE Transactions on Nuclear Science, 13 (3) 514-526 doi:10.1109/tns.1966.4324136
Kraner, H. W. (1982) Radiation Damage in Semiconductor Detectors. IEEE Transactions on Nuclear Science, 29 (3) 1087-1100 doi:10.1109/tns.1982.4336328
Landis, D. A., Madden, N. W., Goulding, F. S. (1986) A Reliable Automatic Liquid Nitrogen Filling System. IEEE Transactions on Nuclear Science, 33 (1) 399-402 doi:10.1109/tns.1986.4337129
 
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