Goulding, F. S., Landis, D. A., Luke, P. N., Madden, N. W., Malone, D. F., Pehl, R. H., Smith, A. R. (1984) Semiconductor Detectors and Double Beta Decay. IEEE Transactions on Nuclear Science, 31 (1) 285-299 doi:10.1109/tns.1984.4333263
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Semiconductor Detectors and Double Beta Decay | ||
Journal | IEEE Transactions on Nuclear Science | ||
Authors | Goulding, F. S. | Author | |
Landis, D. A. | Author | ||
Luke, P. N. | Author | ||
Madden, N. W. | Author | ||
Malone, D. F. | Author | ||
Pehl, R. H. | Author | ||
Smith, A. R. | Author | ||
Year | 1984 | Volume | 31 |
Issue | 1 | ||
Publisher | Institute of Electrical and Electronics Engineers (IEEE) | ||
DOI | doi:10.1109/tns.1984.4333263Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 15569488 | Long-form Identifier | mindat:1:5:15569488:2 |
GUID | 0 | ||
Full Reference | Goulding, F. S., Landis, D. A., Luke, P. N., Madden, N. W., Malone, D. F., Pehl, R. H., Smith, A. R. (1984) Semiconductor Detectors and Double Beta Decay. IEEE Transactions on Nuclear Science, 31 (1) 285-299 doi:10.1109/tns.1984.4333263 | ||
Plain Text | Goulding, F. S., Landis, D. A., Luke, P. N., Madden, N. W., Malone, D. F., Pehl, R. H., Smith, A. R. (1984) Semiconductor Detectors and Double Beta Decay. IEEE Transactions on Nuclear Science, 31 (1) 285-299 doi:10.1109/tns.1984.4333263 | ||
In | (1984) IEEE Transactions on Nuclear Science Vol. 31 (1) Institute of Electrical and Electronics Engineers (IEEE) |
See Also
These are possibly similar items as determined by title/reference text matching only.