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Linderman, Pamela B., O'Kuma, John (1982) EPROM Erasure in Transient and Total Dose Gamma Environments. IEEE Transactions on Nuclear Science, 29 (6) 1674-1675 doi:10.1109/tns.1982.4336426

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Reference TypeJournal (article/letter/editorial)
TitleEPROM Erasure in Transient and Total Dose Gamma Environments
JournalIEEE Transactions on Nuclear Science
AuthorsLinderman, Pamela B.Author
O'Kuma, JohnAuthor
Year1982Volume29
Issue6
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
DOIdoi:10.1109/tns.1982.4336426Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID15567973Long-form Identifiermindat:1:5:15567973:5
GUID0
Full ReferenceLinderman, Pamela B., O'Kuma, John (1982) EPROM Erasure in Transient and Total Dose Gamma Environments. IEEE Transactions on Nuclear Science, 29 (6) 1674-1675 doi:10.1109/tns.1982.4336426
Plain TextLinderman, Pamela B., O'Kuma, John (1982) EPROM Erasure in Transient and Total Dose Gamma Environments. IEEE Transactions on Nuclear Science, 29 (6) 1674-1675 doi:10.1109/tns.1982.4336426
In(1982, December) IEEE Transactions on Nuclear Science Vol. 29 (6) Institute of Electrical and Electronics Engineers (IEEE)

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O'Loughlin, Michael J. (1987) Radiation Effects in High Electron Mobility Transistors: Total Dose Gamma Irradiation. IEEE Transactions on Nuclear Science, 34 (6) 1808-1811 doi:10.1109/tns.1987.4337560
Davis, G. E., Hughes, H. L., Kamins, T. I. (1982) Total Dose Radiation-Bias Effects in Laser-Recrystallized SOI MOSFET's. IEEE Transactions on Nuclear Science, 29 (6) 1685-1689 doi:10.1109/tns.1982.4336429
 
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