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(1982, December) IEEE Transactions on Nuclear Science Vol. 29 (6) Institute of Electrical and Electronics Engineers (IEEE)

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Reference TypeJournal (issue)
JournalIEEE Transactions on Nuclear Science
Year1982 (December)Volume29
Issue<   6
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Mindat Ref. ID15567971Long-form Identifiermindat:1:5:15567971:1
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Full Reference(1982, December) IEEE Transactions on Nuclear Science Vol. 29 (6) Institute of Electrical and Electronics Engineers (IEEE)
Plain Text(1982, December) IEEE Transactions on Nuclear Science Vol. 29 (6) Institute of Electrical and Electronics Engineers (IEEE)
In(1982) IEEE Transactions on Nuclear Science Vol. 29. Institute of Electrical and Electronics Engineers (IEEE)

Contains

(1982) IEEE Transactions on Nuclear Science. IEEE Transactions on Nuclear Science, 29 (6) doi:10.1109/tns.1982.4336373
(1982) 1982 NSREC Short Course on Radiation Effects and System Hardening. IEEE Transactions on Nuclear Science, 29 (6) 1434-1435 doi:10.1109/tns.1982.4336375
(1982) Highlights of the 1982 Nuclear and Space Radiation Effects Conference. IEEE Transactions on Nuclear Science, 29 (6) 1436-1437 doi:10.1109/tns.1982.4336376
(1982) Summary of 1982 Annual Conference on Nuclear and Space Radiation Effects. IEEE Transactions on Nuclear Science, 29 (6) 1438 doi:10.1109/tns.1982.4336377
(1982) 1982 Conference Committee. IEEE Transactions on Nuclear Science, 29 (6) 1439-1440 doi:10.1109/tns.1982.4336380
(1982) IEEE Nuclear and Plasma Sciences Committee Radiation Effects Committee. IEEE Transactions on Nuclear Science, 29 (6) 1439 doi:10.1109/tns.1982.4336379
(1982) Editorial Comments. IEEE Transactions on Nuclear Science, 29 (6) 1439 doi:10.1109/tns.1982.4336378
(1982) Conference Reviewers. IEEE Transactions on Nuclear Science, 29 (6) 1440-1441 doi:10.1109/tns.1982.4336381
(1982) Outstanding Conference Paper Award 1982 IEEE Conference on Nuclear and Space Radiation Effects. IEEE Transactions on Nuclear Science, 29 (6) 1442 doi:10.1109/tns.1982.4336382
(1982) Distinguished Poster Paper Award 1982 IEEE Conference on Nuclear and Space Radiation Effects. IEEE Transactions on Nuclear Science, 29 (6) 1443 doi:10.1109/tns.1982.4336383
Boesch, Harold E. (1982) Interface-State Generation in Thick SiO2 Layers. IEEE Transactions on Nuclear Science, 29 (6) 1445-1451 doi:10.1109/tns.1982.4336384
Pierce, Donald G., Mason, Robert M. (1982) The Characterization of Transistor Electrical Overstress Failure Probability Density Functions. IEEE Transactions on Nuclear Science, 29 (6) 1452-1458 doi:10.1109/tns.1982.4336385
Lenahan, P. M., Dressendorfer, P. V. (1982) Radiation-Induced Paramagnetic Defects in MOS Structures. IEEE Transactions on Nuclear Science, 29 (6) 1459-1461 doi:10.1109/tns.1982.4336386
Smeltzer, R. K. (1982) Hole Trap Creation in SiO2 by Phosphorus Ion Penetration of Polycrystalline Silicon. IEEE Transactions on Nuclear Science, 29 (6) 1467-1470 doi:10.1109/tns.1982.4336388
Barnes, C. E. (1982) Laser Diode-Induced Photobleaching at Low Temperatures in Co-60 Irradiated Fibers. IEEE Transactions on Nuclear Science, 29 (6) 1479-1483 doi:10.1109/tns.1982.4336390
Gilbert, R. M. (1982) Photobleaching of Radiation-Induced Color Centers in a Germania-Doped Glass Fiber. IEEE Transactions on Nuclear Science, 29 (6) 1484-1488 doi:10.1109/tns.1982.4336391
Blair, G. R., Tangonan, G. L. (1982) Metal Coated Fibers for Use in the Radiation Environment. IEEE Transactions on Nuclear Science, 29 (6) 1489-1492 doi:10.1109/tns.1982.4336392
Mueller, G. P., Wilsey, N. D., Rosen, Mervine (1982) The Structure of Displacement Cascades in Silicon. IEEE Transactions on Nuclear Science, 29 (6) 1493-1497 doi:10.1109/tns.1982.4336393
Binkley, David M. (1982) A Radiation-Hardened Accelerometer Preamplifier for 2 i 108 Rads(Si) Total Dose. IEEE Transactions on Nuclear Science, 29 (6) 1499-1507 doi:10.1109/tns.1982.4336394
Myers, D. K., Herzog, William (1982) Feasibility Study on the Design and Radiation Testing of Complex Functions for 2 i 108 Rads (Si) IEEE Transactions on Nuclear Science, 29 (6) 1508-1511 doi:10.1109/tns.1982.4336395
Shpancer, I., Kinsner, W. (1982) A Systolic Radiation Monitoring System. IEEE Transactions on Nuclear Science, 29 (6) 1512-1518 doi:10.1109/tns.1982.4336396
Jassby, D. L. (1982) Tokamak Fusion Generators for Nuclear Radiation Effects Testing. IEEE Transactions on Nuclear Science, 29 (6) 1519-1524 doi:10.1109/tns.1982.4336397
Anderson, W. T., Simons, M., King, E. E., Dietrich, H. B., Lambert, R. J. (1982) Reduction of Long-Term Transient Radiation Response in Ion Implanted GaAs FETs. IEEE Transactions on Nuclear Science, 29 (6) 1533-1538 doi:10.1109/tns.1982.4336399
Wiczer, J. J., Dawson, L. R., Osbourn, G. C., Barnes, C. E. (1982) Permanent Damage Effects in Si and AlGaAs/GaAs Photodiodes. IEEE Transactions on Nuclear Science, 29 (6) 1539-1544 doi:10.1109/tns.1982.4336400
Moghe, S. B., Gutmann, R. J., Borrego, J. M. (1982) Radiation Effects on Distortion Characteristics of Power GaAs MESFET Amplifiers. IEEE Transactions on Nuclear Science, 29 (6) 1545-1550 doi:10.1109/tns.1982.4336401
Varnell, Larry, Langford, D. E. (1982) Radiation Effects in IRAS Extrinsic Infrared Detectors. IEEE Transactions on Nuclear Science, 29 (6) 1551-1554 doi:10.1109/tns.1982.4336402
Blackburn, D. L., Berning, D. W., Benedetto, J. M., Galloway, K. F. (1982) Ionizing Radiation Effects on Power MOSFETS during High Speed Switching. IEEE Transactions on Nuclear Science, 29 (6) 1555-1558 doi:10.1109/tns.1982.4336403
Seehra, S. S., Slusark, W. J. (1982) The Effect of Operating Conditions on the Radiation Resistance of VDMOS Power FETs. IEEE Transactions on Nuclear Science, 29 (6) 1559-1563 doi:10.1109/tns.1982.4336404
Volmerange, H., Witteles, A. A. (1982) Radiation Effects on MOS Power Transistors. IEEE Transactions on Nuclear Science, 29 (6) 1565-1568 doi:10.1109/tns.1982.4336405
Kleiner, C. T., Messenger, G. C. (1982) An Improved Bipolar Junction Transistor Model for Electrical and Radiation Effects. IEEE Transactions on Nuclear Science, 29 (6) 1569-1579 doi:10.1109/tns.1982.4336406
Mueller, G. P., Rosen, Mervine (1982) Neutron Induced Permanent Damage in Josephson Junctions. IEEE Transactions on Nuclear Science, 29 (6) 1580-1581 doi:10.1109/tns.1982.4336407
Mandell, M. J., Katz, I., Cooke, D. L. (1982) Potentials on Large Spacecraft in LEO. IEEE Transactions on Nuclear Science, 29 (6) 1583-1588 doi:10.1109/tns.1982.4336408
Passenheim, B. C., van Lint, V. A. J., Riddell, J. D., Kitterer, R. (1982) Electrical Conductivity and Discharge in Spacecraft Thermal Control Dielectrics. IEEE Transactions on Nuclear Science, 29 (6) 1594-1600 doi:10.1109/tns.1982.4336410
van Lint, V. A. J., Erler, J. W. (1982) Measurement of Transfer Impedance of Thermal Blankets. IEEE Transactions on Nuclear Science, 29 (6) 1601-1606 doi:10.1109/tns.1982.4336411
Snyder, D. B. (1982) Environmentally Induced Discharges in a Solar Array. IEEE Transactions on Nuclear Science, 29 (6) 1607-1609 doi:10.1109/tns.1982.4336412
Leung, P., Plamp, G. (1982) Characteristics of RF Resulting from Dielectric Discharges. IEEE Transactions on Nuclear Science, 29 (6) 1610-1614 doi:10.1109/tns.1982.4336413
Balmain, K. G., Gossland, M., Reeves, R. D., Kuller, W. G. (1982) Optical Measurement of the Velocity of Dielectric Surface Arcs. IEEE Transactions on Nuclear Science, 29 (6) 1615-1617 doi:10.1109/tns.1982.4336414
Gossland, M., Balmain, K. G. (1982) Barriers to Flashover Discharge Arcs on Teflon. IEEE Transactions on Nuclear Science, 29 (6) 1618-1620 doi:10.1109/tns.1982.4336415
Goldstein, R. D., Brown, E. M., Maldoon, L. C. (1982) Usage of ITO to Prevent Spacecraft Charging. IEEE Transactions on Nuclear Science, 29 (6) 1621-1628 doi:10.1109/tns.1982.4336416
Bouquet, F. L., Koprowski, K. F. (1982) Radiation Effects on Spacecraft Materials for Jupiter and Near-Earth Orbiters. IEEE Transactions on Nuclear Science, 29 (6) 1629-1632 doi:10.1109/tns.1982.4336417
Coakley, P., Kitterer, B., Treadaway, M. (1982) Charging and Discharging Characteristics of Dielectric Materials Exposed to Low- and Mid-Energy Electrons. IEEE Transactions on Nuclear Science, 29 (6) 1639-1643 doi:10.1109/tns.1982.4336419
Labonte, K. (1982) Radiation-Induced Charge Dynamics in Dielectrics. IEEE Transactions on Nuclear Science, 29 (6) 1650-1653 doi:10.1109/tns.1982.4336421
Marks, Kenneth, Measel, Paul (1982) Total Dose Test Results for the 8086 Microprocessor. IEEE Transactions on Nuclear Science, 29 (6) 1662-1664 doi:10.1109/tns.1982.4336423
Witteles, A. A., Volmerange, H. (1982) Radiation Response of Advanced Dynamic Random Access Memories (DRAMs) IEEE Transactions on Nuclear Science, 29 (6) 1665-1668 doi:10.1109/tns.1982.4336424
Wilkin, Neil D., Self, Charles T. (1982) Temperature Effects on Failure and Annealing Behavior in Dynamic Random Access Memories. IEEE Transactions on Nuclear Science, 29 (6) 1669-1673 doi:10.1109/tns.1982.4336425
Linderman, Pamela B., O'Kuma, John (1982) EPROM Erasure in Transient and Total Dose Gamma Environments. IEEE Transactions on Nuclear Science, 29 (6) 1674-1675 doi:10.1109/tns.1982.4336426
Davis, G. E., Hughes, H. L., Kamins, T. I. (1982) Total Dose Radiation-Bias Effects in Laser-Recrystallized SOI MOSFET's. IEEE Transactions on Nuclear Science, 29 (6) 1685-1689 doi:10.1109/tns.1982.4336429
Chang, C. P. (1982) Self-Aligned Phosphorus Doped Polysilicon Gate MOS Device Radiation Hardening. IEEE Transactions on Nuclear Science, 29 (6) 1702-1706 doi:10.1109/tns.1982.4336432
Napoli, L. S., Smeltzer, R. K., Yeh, J. L., Heagerty, W. F. (1982) CMOS/SOS 4K RAMs Hardened to 100 Krads(Si) IEEE Transactions on Nuclear Science, 29 (6) 1707-1711 doi:10.1109/tns.1982.4336433
Abare, W. E., Huffman, D. D., Moffett, G. E. (1982) Radiation Response of Two Harris Semiconductor Radiation Hardened 1K CMOS RAMs. IEEE Transactions on Nuclear Science, 29 (6) 1712-1715 doi:10.1109/tns.1982.4336434
Wrobel, T. F., Evans, D. C. (1982) Rapid Annealing in Advanced Bipolar Microcircuits. IEEE Transactions on Nuclear Science, 29 (6) 1721-1726 doi:10.1109/tns.1982.4336436
Poblenz, F. W., Carroll, R. G., Whitmire, D. A., Cheney, B. W., Walthall, D. L. (1982) Total Dose Response of STL and I2L Logic Devices. IEEE Transactions on Nuclear Science, 29 (6) 1727-1732 doi:10.1109/tns.1982.4336437
Sanders, T. J., Boarman, J. W., Wood, G. M., Kasten, A. J. (1982) A Radiation-Hardened 1K-Bit Dielectrically Isolated Random Access Memory. IEEE Transactions on Nuclear Science, 29 (6) 1733-1736 doi:10.1109/tns.1982.4336438
Baxter, N. E., Collings, I, Hill, G. J., Roberts, B. C. (1982) Evaluation of the Radiation Hardness of the Ferranti F100-L Microprocessor in an Operating System. IEEE Transactions on Nuclear Science, 29 (6) 1737-1739 doi:10.1109/tns.1982.4336439
Woods, John P., MacPhee, Joseph V. (1982) Total Dose Susceptibility of the SBP 9989 Microprocessor. IEEE Transactions on Nuclear Science, 29 (6) 1740-1743 doi:10.1109/tns.1982.4336440
Riddell, J. D., Chervenak, J. G., van Lint, V. A. J. (1982) Ionization-Induced Breakdown and Conductivity of Satellite Dielectrics. IEEE Transactions on Nuclear Science, 29 (6) 1754-1759 doi:10.1109/tns.1982.4336442
Schmidt, Michael J., Edelman, David, Setty, Prem N. (1982) Methodology for Assessing Cable Current from IEMP in SREMP Environments. IEEE Transactions on Nuclear Science, 29 (6) 1760-1764 doi:10.1109/tns.1982.4336443
van Lint, V. A. J., Stettner, R., Passenheim, B. C. (1982) Relating SGEMP Photon Test Exposures to Spacecraft Survivability Expectations. IEEE Transactions on Nuclear Science, 29 (6) 1765-1769 doi:10.1109/tns.1982.4336444
Nielsen, L. Carlisle, Crain, Charles R. (1982) SGEMP-Induced Transfer Admittance Coupling in Cable Bundles. IEEE Transactions on Nuclear Science, 29 (6) 1770-1774 doi:10.1109/tns.1982.4336445
Counsil, J. A., Eklund, C. A., Erskine, J. W., Stringer, T. A. (1982) Investigation of Anomalous CXR Response of Filled Cables. IEEE Transactions on Nuclear Science, 29 (6) 1775-1779 doi:10.1109/tns.1982.4336446
Seidler, W., Keyser, R., Walters, D., Harper, H. (1982) The Limits to Hardening Electronic Boxes to IEMP Coupling. IEEE Transactions on Nuclear Science, 29 (6) 1780-1786 doi:10.1109/tns.1982.4336447
Dancz, John, Stettner, Roger (1982) Preliminary Consideration of the Modification of the SGEMP Response of a Triaxial Satellite Due to Electrn Clouds. IEEE Transactions on Nuclear Science, 29 (6) 1787-1792 doi:10.1109/tns.1982.4336448
Woods, A. J., Treadaway, M. J., Nunan, S., Higgins, D. (1982) Air-Enhanced SGEMP Response - An Experimental and Analytical Investigation. IEEE Transactions on Nuclear Science, 29 (6) 1793-1797 doi:10.1109/tns.1982.4336449
Goldstein, B. (1982) Avalanching in a One-Dimensional Diode. IEEE Transactions on Nuclear Science, 29 (6) 1798-1801 doi:10.1109/tns.1982.4336450
Azarewicz, J. L., Hardwick, W. H. (1982) Latchup Window Tests. IEEE Transactions on Nuclear Science, 29 (6) 1803-1808 doi:10.1109/tns.1982.4336451
King, E. E., Ahlport, B., Tettemer, G., Mulker, K., Linderman, P. (1982) Transient Radiation Screening of Silicon Devices Using Backside Laser Irradiation. IEEE Transactions on Nuclear Science, 29 (6) 1809-1815 doi:10.1109/tns.1982.4336452
Johnston, Allan H. (1982) Geometrical Considerations in the Transient Ionization Testing of Digital Logic Circuits. IEEE Transactions on Nuclear Science, 29 (6) 1816-1820 doi:10.1109/tns.1982.4336453
Milder, F. L., Shedd, W. (1982) A Portable System for Upset and Transient Upset Testing of VLSI Circuits. IEEE Transactions on Nuclear Science, 29 (6) 1827-1831 doi:10.1109/tns.1982.4336455
Palkuti, Leslie J., LePage, James J. (1982) X-Ray Wafer Probe for Total Dose Testing. IEEE Transactions on Nuclear Science, 29 (6) 1832-1837 doi:10.1109/tns.1982.4336456
Jeffers, L. C., Andrews, J. L., O'Donnell, H. B., Rosen, F. (1982) Hardness Assurance Experience on the DSCS III Spacecraft Program. IEEE Transactions on Nuclear Science, 29 (6) 1838-1842 doi:10.1109/tns.1982.4336457
van Lint, V. A. J. (1982) Electromagnetic Emission from Chemical Explosions. IEEE Transactions on Nuclear Science, 29 (6) 1843-1849 doi:10.1109/tns.1982.4336458
Bushell, M., Manriquez, R., Merkel, G., Scharf, W. D., Baker, G. (1982) Electronic Response of Long Cylindrical Structures and Large Loops in an Inhomogeneous Medium with Time-Varying Conductivity. IEEE Transactions on Nuclear Science, 29 (6) 1850-1855 doi:10.1109/tns.1982.4336459
Williams, J. W., Price, H. J., Carroll, E. R., Libelo, L. F. (1982) Responses of a Conducting Cylinder to Pulsed Surface Current Injection. IEEE Transactions on Nuclear Science, 29 (6) 1856-1861 doi:10.1109/tns.1982.4336460
Williams, John W., Arman, Shahnaz, Sterk, Frederick J., Carroll, Eugene R. (1982) Capabilities and Limitations in Pulsed Surface Current Injection Techniques for EMP Testing. IEEE Transactions on Nuclear Science, 29 (6) 1862-1867 doi:10.1109/tns.1982.4336461
Stettner, R., Dancz, J., Gilbert, J., Chavin, S., Crevier, W., Savage, E., Curry, R., Nonnast, J. (1982) Comparison of a One-Dimensional and a Three-Dimensional SREMP Model for an Overhead Line. IEEE Transactions on Nuclear Science, 29 (6) 1868-1873 doi:10.1109/tns.1982.4336462
Higgins, D. F., O'Dean, D. E. M., Smith, K. S. (1982) SREMP Coupling to Long Buried Lines - A Comparison of Trmnsmission Line and Finite-Difference Solutions. IEEE Transactions on Nuclear Science, 29 (6) 1874-1879 doi:10.1109/tns.1982.4336463
Chervenak, J. G., van Lint, V. A. J. (1982) Experiments on Air Conductivity Relevant to Source Region EMP. IEEE Transactions on Nuclear Science, 29 (6) 1880-1886 doi:10.1109/tns.1982.4336464
van Lint, V. A. J., Berger, R. A., Crevier, W., Pettus, E., Dancz, J., Stettner, R., Naff, T. (1982) A Discus EMP Simulator Design for Long Narrow Buried Objects. IEEE Transactions on Nuclear Science, 29 (6) 1903-1908 doi:10.1109/tns.1982.4336468
Tigner, John E., Frederick, Donald, Setty, Prem N., Sutton, Richard W. (1982) Electromagnetic Coupling through Multiconductor Cable Shields. IEEE Transactions on Nuclear Science, 29 (6) 1914-1919 doi:10.1109/tns.1982.4336470
Parkinson, E. R., Levy, P. H. (1982) Monte Carlo Analysis of the EMP Response of a Random-Lay Cable. IEEE Transactions on Nuclear Science, 29 (6) 1920-1923 doi:10.1109/tns.1982.4336471
Pettus, Erle (1982) An Examination of the Shielding Provided by the Use of Cable Trays. IEEE Transactions on Nuclear Science, 29 (6) 1924-1929 doi:10.1109/tns.1982.4336472
Yu, Y. B. (1982) Advanced Rapid Attenuation Measurement System (ARAMS) IEEE Transactions on Nuclear Science, 29 (6) 1930-1934 doi:10.1109/tns.1982.4336473
Manriquez, R. P., Gray, R. F., Loftus, J. J. (1982) Theoretical and Scale Model EMP Response Analysis of Interconnected System Cables. IEEE Transactions on Nuclear Science, 29 (6) 1935-1942 doi:10.1109/tns.1982.4336474
Simpson, Larry T., Holland, Richard, Arman, Shahnaz (1982) Treatment of Late Time Instabilities in Finite-Difference EMP Scattering Codes. IEEE Transactions on Nuclear Science, 29 (6) 1943-1948 doi:10.1109/tns.1982.4336475
Oliphant, W. F., Dozier, C. M., Brown, D. G., Stephanakis, S. J., Boller, J. R., Cooperstein, G. (1982) A Characterization and Optimization Study of Gamble II as an X-Ray Bremsstrahlung Source. IEEE Transactions on Nuclear Science, 29 (6) 1949-1954 doi:10.1109/tns.1982.4336476
Halbleib, John A. (1982) Time-Dependent Monte Carlo Deposition Rate from Flash X-Ray Sources. IEEE Transactions on Nuclear Science, 29 (6) 1955-1959 doi:10.1109/tns.1982.4336477
Chang, J., Stauber, M. (1982) Thermoluminescence Response of Lithium Fluoride to Energetic Light Ions. IEEE Transactions on Nuclear Science, 29 (6) 1960-1965 doi:10.1109/tns.1982.4336478
Brucker, G. J., Stassinopoulos, E. G., Van Gunten, O., August, L. S., Jordan, T. M. (1982) The Damage Equivalence of Electrons, Protons, and Gamma Rays in MOS Devices. IEEE Transactions on Nuclear Science, 29 (6) 1966-1969 doi:10.1109/tns.1982.4336479
Nichols, D. K., Price, W. E., Gauthier, M. K. (1982) A Comparison of Radiation Damage in Transistors from Cobalt-60 Gamma Rays and 2.2 MeV Electrons. IEEE Transactions on Nuclear Science, 29 (6) 1970-1974 doi:10.1109/tns.1982.4336480
Holmes-Siedle, Andrew, Adams, Leonard (1982) Dosimetric Silica Films: The Influence of Fields on the Capture of Positive Charge. IEEE Transactions on Nuclear Science, 29 (6) 1975-1979 doi:10.1109/tns.1982.4336481
Long, D. M., Millward, D. G., Wallace, J. (1982) Dose Enhancement Effects in Semiconductor Devices. IEEE Transactions on Nuclear Science, 29 (6) 1980-1984 doi:10.1109/tns.1982.4336482
Garth, J. C., Murray, B. W., Dolan, R. P. (1982) Soft X-Ray Induced Energy Deposition in a Three-Layered System: Au/C/PBS. IEEE Transactions on Nuclear Science, 29 (6) 1985-1991 doi:10.1109/tns.1982.4336483
Brown, D. B., Dozier, C. M. (1982) Reducing Errors in Dosimetry Caused by Low Energy Components of Co-60 and Flash X-Ray Sources. IEEE Transactions on Nuclear Science, 29 (6) 1996-1999 doi:10.1109/tns.1982.4336485
Frederickson, A. R., Woolf, S. (1982) Electric Fields in keV Electron Irradiated Polymers. IEEE Transactions on Nuclear Science, 29 (6) 2004-2011 doi:10.1109/tns.1982.4336487
Farrell, Gary E., McNulty, Peter J. (1982) Microdosimetric Aspects of Proton-Induced Nuclear Reactions in Thin Layers of Silicon. IEEE Transactions on Nuclear Science, 29 (6) 2012-2016 doi:10.1109/tns.1982.4336488
McLean, F. B., Oldham, T. R. (1982) Charge Funneling in N- and P-Type Si Substrates. IEEE Transactions on Nuclear Science, 29 (6) 2017-2023 doi:10.1109/tns.1982.4336489
Diehl, S. E., Ochoa, A., Dressendorfer, P. V., Koga, R., Kolasinski, W. A. (1982) Error Analysis and Prevention of Cosmic Ion-Induced Soft Errors in Static CMOS RAMs. IEEE Transactions on Nuclear Science, 29 (6) 2032-2039 doi:10.1109/tns.1982.4336491
Andrews, J. L., Schroeder, J. E., Gingerich, B. L., Kolasinski, W. A., Koga, R., Diehl, S. E. (1982) Single Event Error Immune CMOS RAM. IEEE Transactions on Nuclear Science, 29 (6) 2040-2043 doi:10.1109/tns.1982.4336492
Kolasinski, W. A., Koga, R., Blake, J. B., Brucker, G., Pandya, P., Petersen, E., Price, W. (1982) Single Event Upset Vulnerability of Selected 4K and 16K CMOS Static RAM's. IEEE Transactions on Nuclear Science, 29 (6) 2044-2048 doi:10.1109/tns.1982.4336493
Pickel, James C. (1982) Effect of CMOS Miniaturization on Cosmic-Ray-Induced Error Rate. IEEE Transactions on Nuclear Science, 29 (6) 2049-2054 doi:10.1109/tns.1982.4336494
Petersen, E. L., Shapiro, P., Adams, J. H., Burke, E. A. (1982) Calculation of Cosmic-Ray Induced Soft Upsets and Scaling in VLSI Devices. IEEE Transactions on Nuclear Science, 29 (6) 2055-2063 doi:10.1109/tns.1982.4336495
Price, W. E., Nichols, D. K., Measel, P. R., Wahlin, K. L. (1982) Single Event Upset Sensitivity of Low Power Schottky Devices. IEEE Transactions on Nuclear Science, 29 (6) 2064-2066 doi:10.1109/tns.1982.4336496
Shapiro, P., Campbell, A. B., Petersen, E. L., Myers, L. T. (1982) Proton-Induced Single Event Upsets in NMOS Microprocessors. IEEE Transactions on Nuclear Science, 29 (6) 2072-2075 doi:10.1109/tns.1982.4336498
Campbell, A. B. (1982) Upsets in Error Detection and Correction Integrated Circuits. IEEE Transactions on Nuclear Science, 29 (6) 2076-2080 doi:10.1109/tns.1982.4336499
Nichols, D. K., Price, W. E., Andrews, J. L. (1982) The Dependence of Single Event Upset on Proton Energy (15-590 MeV) IEEE Transactions on Nuclear Science, 29 (6) 2081-2084 doi:10.1109/tns.1982.4336500
Bradford, John N. (1982) Microvolume Energy Deposition from High Energy Proton-Silicon Reactions. IEEE Transactions on Nuclear Science, 29 (6) 2085-2089 doi:10.1109/tns.1982.4336501
Magno, R., Nisenoff, M., Shelby, R., Kidd, J., Campbell, A. B. (1982) Alpha Induced Upsets in Josephson Tunnel Junctions. IEEE Transactions on Nuclear Science, 29 (6) 2090-2094 doi:10.1109/tns.1982.4336502
Adams, James H. (1982) The Natural Radiation Environment inside Spacecraft. IEEE Transactions on Nuclear Science, 29 (6) 2095-2100 doi:10.1109/tns.1982.4336503
Winokur, P. S. (1982) Limitations in the Use of Linear System Theory for the Prediction of Hardened-MOS Device Response in Space Satellite Environments. IEEE Transactions on Nuclear Science, 29 (6) 2101-2106 doi:10.1109/tns.1982.4336504
Tumolillo, Thomas A., Wondra, John P. (1982) Simulation Fidelity Issues for SREMP or SGEMP Tests. IEEE Transactions on Nuclear Science, 29 (6) 2107-2114 doi:10.1109/tns.1982.4336505
Sekihara, Kensuke, Kohno, Hideki, Yamamoto, Shinji (1982) Theoretical Prediction of X-Ray CT Image Quality Using Contrast-Detail Diagrams. IEEE Transactions on Nuclear Science, 29 (6) 2115-2121 doi:10.1109/tns.1982.4336506
(1982) Erratum. IEEE Transactions on Nuclear Science, 29 (6) 2122 doi:10.1109/tns.1982.4336507
(1982) Affiliate Plan of the IEEE Nuclear and Plasma Sciences Society. IEEE Transactions on Nuclear Science, 29 (6) doi:10.1109/tns.1982.4336510
(1982) [Front cover]. IEEE Transactions on Nuclear Science, 29 (6) doi:10.1109/tns.1982.4336372
(1982) 1982 Index IEEE Transactions on Nuclear Science Vol. NS-29. IEEE Transactions on Nuclear Science, 29 (6) 1-34 doi:10.1109/tns.1982.4336508
(1982) Information for authors. IEEE Transactions on Nuclear Science, 29 (6) 34 doi:10.1109/tns.1982.4336509
(1982) Table of contents. IEEE Transactions on Nuclear Science, 29 (6) 1429-1433 doi:10.1109/tns.1982.4336374
Grunthaner, F. J., Grunthaner, P. J., Maserjian, J. (1982) Radiation-Induced Defects in SiO2 as Determined with XPS. IEEE Transactions on Nuclear Science, 29 (6) 1462-1466 doi:10.1109/tns.1982.4336387
Knoll, M., Braunig, D., Fahrner, W. R. (1982) Generation of Oxide Charge and Interface States by Ionizing Radiation and by Tunnel Injection Experiments. IEEE Transactions on Nuclear Science, 29 (6) 1471-1478 doi:10.1109/tns.1982.4336389
Pease, R. L., Barnum, J. R., Vulliet, W. G., van Lint, V. A. J., Wrobel, T. F. (1982) Silicon Solar Cell Damage from Electrical Overstress. IEEE Transactions on Nuclear Science, 29 (6) 1525-1532 doi:10.1109/tns.1982.4336398
Inouye, G. T., Chaky, R. C. (1982) Enhanced Electron Emission from Positive Dielectric/Negative Metal Configurations on Spacecraft. IEEE Transactions on Nuclear Science, 29 (6) 1589-1593 doi:10.1109/tns.1982.4336409
Hazelton, R. C., Yadlowsky, E. J. (1982) Effect of Laser Produced Pinholes upon the Charging Characteristics of Spacecraft Thermal Control Surfaces. IEEE Transactions on Nuclear Science, 29 (6) 1633-1638 doi:10.1109/tns.1982.4336418
Sessler, Gerhard M., West, James E., Gerhard-Multhaupt, Reimund, von Seggern, Heinz (1982) Nondestructive Laser Method for Measuring Charge Profiles in Irradiated Polymer Films. IEEE Transactions on Nuclear Science, 29 (6) 1644-1649 doi:10.1109/tns.1982.4336420
Zuleeg, R., Notthoff, J. K., Troeger, G. L. (1982) Ionizing Radiation Response of GaAs JFETs and DCFL Circuits. IEEE Transactions on Nuclear Science, 29 (6) 1655-1661 doi:10.1109/tns.1982.4336422
Wilson, C. L., Blue, J. L. (1982) Modeling of Ionizing Radiation Effects in Short-Channel MOSFETs. IEEE Transactions on Nuclear Science, 29 (6) 1676-1680 doi:10.1109/tns.1982.4336427
Chen, J. Y., Henderson, R. C., Martin, R., Patterson, D. O. (1982) Enhanced Radiation Effects on Submicron Narrow-Channel NMOS. IEEE Transactions on Nuclear Science, 29 (6) 1681-1684 doi:10.1109/tns.1982.4336428
Kim, J. S., Bluzer, N. (1982) Gamma-Ray Irradiation Effects on VLSI Geometry MOSFETs Fabricated on Laser Recrystallized SOI Wafers. IEEE Transactions on Nuclear Science, 29 (6) 1690-1695 doi:10.1109/tns.1982.4336430
Peckerar, M. C., Dozier, C. M., Brown, D. B., Patterson, D., McCarthy, D., Ma, D. (1982) Radiation Effects Introduced by X-Ray Lithography in MOS Devices. IEEE Transactions on Nuclear Science, 29 (6) 1697-1701 doi:10.1109/tns.1982.4336431
Danchenko, Vitaly, Fang, P. H., Brashears, Sidney S. (1982) Thermal Annealing of Radiation Damage in CMOS ICs in the Temperature Range -140°C to +375°C. IEEE Transactions on Nuclear Science, 29 (6) 1716-1720 doi:10.1109/tns.1982.4336435
Shaeffer, D. Lynn, Siegel, Joel M. (1982) Analysis of Time-Dependent Radiation-Induced Conductivity in Dielectrics and Effect on Cable SGEMP. IEEE Transactions on Nuclear Science, 29 (6) 1745-1753 doi:10.1109/tns.1982.4336441
Namenson, A. I. (1982) Hardness Assurance and Overtesting. IEEE Transactions on Nuclear Science, 29 (6) 1821-1826 doi:10.1109/tns.1982.4336454
Flanagan, T. M., Mallon, C. E., Denson, R., Smith, Ian (1982) Electrical Breakdown Characteristics of Soil. IEEE Transactions on Nuclear Science, 29 (6) 1887-1890 doi:10.1109/tns.1982.4336465
van Lint, V. A. J., Erler, J. W. (1982) Electric Breakdown of Earth in Coaxial Geometry. IEEE Transactions on Nuclear Science, 29 (6) 1891-1896 doi:10.1109/tns.1982.4336466
Leadon, R. E., Flanagan, T. M., Mallon, C. E., Denson, R. (1982) Vaporization/Restrike Characteristics of Buried Insulated Conductors. IEEE Transactions on Nuclear Science, 29 (6) 1897-1902 doi:10.1109/tns.1982.4336467
Ford, R. D., Lupton, W. H., Vitkovitsky, I. M., Bell, M., Denson, R. (1982) Current Source for Testing Long Line EMP Surge Arrestors. IEEE Transactions on Nuclear Science, 29 (6) 1909-1913 doi:10.1109/tns.1982.4336469
Lowe, L. F., Cappelli, J. R., Burke, E. A. (1982) Dosimetry Errors in Co-60 Gamma Cells Due to Transition Zone Phenomena. IEEE Transactions on Nuclear Science, 29 (6) 1992-1995 doi:10.1109/tns.1982.4336484
August, L. S. (1982) Estimating and Reducing Errors in MOS Dosimeters Caused by Exposure to Different Radiations. IEEE Transactions on Nuclear Science, 29 (6) 2000-2003 doi:10.1109/tns.1982.4336486
Messenger, G. C. (1982) Collection of Charge on Junction Nodes from Ion Tracks. IEEE Transactions on Nuclear Science, 29 (6) 2024-2031 doi:10.1109/tns.1982.4336490
Campbell, A. B., Knudson, A. R. (1982) Charge Collection Measurements for Energetic Ions in Silicon. IEEE Transactions on Nuclear Science, 29 (6) 2067-2071 doi:10.1109/tns.1982.4336497

See Also

These are possibly similar items as determined by title/reference text matching only.

(1982) IEEE Transactions on Nuclear Science Vol. 29 (1) Institute of Electrical and Electronics Engineers (IEEE)
(1982) IEEE Transactions on Nuclear Science Vol. 29 (2) Institute of Electrical and Electronics Engineers (IEEE)
(1982, June) IEEE Transactions on Nuclear Science Vol. 29 (3) Institute of Electrical and Electronics Engineers (IEEE)
(1982, August) IEEE Transactions on Nuclear Science Vol. 29 (4) Institute of Electrical and Electronics Engineers (IEEE)
(1982, October) IEEE Transactions on Nuclear Science Vol. 29 (5) Institute of Electrical and Electronics Engineers (IEEE)
(1988, December) IEEE Transactions on Nuclear Science Vol. 35 (6) Institute of Electrical and Electronics Engineers (IEEE)
(1989, December) IEEE Transactions on Nuclear Science Vol. 36 (6) Institute of Electrical and Electronics Engineers (IEEE)
(1990, December) IEEE Transactions on Nuclear Science Vol. 37 (6) Institute of Electrical and Electronics Engineers (IEEE)
(1991, December) IEEE Transactions on Nuclear Science Vol. 38 (6) Institute of Electrical and Electronics Engineers (IEEE)
(1992, December) IEEE Transactions on Nuclear Science Vol. 39 (6) Institute of Electrical and Electronics Engineers (IEEE)
(1993, December) IEEE Transactions on Nuclear Science Vol. 40 (6) Institute of Electrical and Electronics Engineers (IEEE)
 
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