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Wrobel, T. F., Evans, D. C. (1982) Rapid Annealing in Advanced Bipolar Microcircuits. IEEE Transactions on Nuclear Science, 29 (6) 1721-1726 doi:10.1109/tns.1982.4336436

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Reference TypeJournal (article/letter/editorial)
TitleRapid Annealing in Advanced Bipolar Microcircuits
JournalIEEE Transactions on Nuclear Science
AuthorsWrobel, T. F.Author
Evans, D. C.Author
Year1982Volume29
Issue6
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
DOIdoi:10.1109/tns.1982.4336436Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID15568052Long-form Identifiermindat:1:5:15568052:6
GUID0
Full ReferenceWrobel, T. F., Evans, D. C. (1982) Rapid Annealing in Advanced Bipolar Microcircuits. IEEE Transactions on Nuclear Science, 29 (6) 1721-1726 doi:10.1109/tns.1982.4336436
Plain TextWrobel, T. F., Evans, D. C. (1982) Rapid Annealing in Advanced Bipolar Microcircuits. IEEE Transactions on Nuclear Science, 29 (6) 1721-1726 doi:10.1109/tns.1982.4336436
In(1982, December) IEEE Transactions on Nuclear Science Vol. 29 (6) Institute of Electrical and Electronics Engineers (IEEE)

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