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Shapiro, P., Campbell, A. B., Petersen, E. L., Myers, L. T. (1982) Proton-Induced Single Event Upsets in NMOS Microprocessors. IEEE Transactions on Nuclear Science, 29 (6) 2072-2075 doi:10.1109/tns.1982.4336498

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Reference TypeJournal (article/letter/editorial)
TitleProton-Induced Single Event Upsets in NMOS Microprocessors
JournalIEEE Transactions on Nuclear Science
AuthorsShapiro, P.Author
Campbell, A. B.Author
Petersen, E. L.Author
Myers, L. T.Author
Year1982Volume29
Issue6
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
DOIdoi:10.1109/tns.1982.4336498Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID15568051Long-form Identifiermindat:1:5:15568051:9
GUID0
Full ReferenceShapiro, P., Campbell, A. B., Petersen, E. L., Myers, L. T. (1982) Proton-Induced Single Event Upsets in NMOS Microprocessors. IEEE Transactions on Nuclear Science, 29 (6) 2072-2075 doi:10.1109/tns.1982.4336498
Plain TextShapiro, P., Campbell, A. B., Petersen, E. L., Myers, L. T. (1982) Proton-Induced Single Event Upsets in NMOS Microprocessors. IEEE Transactions on Nuclear Science, 29 (6) 2072-2075 doi:10.1109/tns.1982.4336498
In(1982, December) IEEE Transactions on Nuclear Science Vol. 29 (6) Institute of Electrical and Electronics Engineers (IEEE)

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Guenzer, C. S., Campbell, A. B., Shapiro, P. (1981) Single Event Upsets in NMOS Microprocessors. IEEE Transactions on Nuclear Science, 28 (6) 3955-3958 doi:10.1109/tns.1981.4335654
Bendel, W. L., Petersen, E. L. (1984) Predicting Single Event Upsets in the Earth's Proton Belts. IEEE Transactions on Nuclear Science, 31 (6) 1201-1206 doi:10.1109/tns.1984.4333483
Petersen, E. L., Shapiro, P., Adams, J. H., Burke, E. A. (1982) Calculation of Cosmic-Ray Induced Soft Upsets and Scaling in VLSI Devices. IEEE Transactions on Nuclear Science, 29 (6) 2055-2063 doi:10.1109/tns.1982.4336495
Bendel, W. L., Petersen, E. L. (1983) Proton Upsets in Orbit. IEEE Transactions on Nuclear Science, 30 (6) 4481-4485 doi:10.1109/tns.1983.4333158
Campbell, A. B. (1982) Upsets in Error Detection and Correction Integrated Circuits. IEEE Transactions on Nuclear Science, 29 (6) 2076-2080 doi:10.1109/tns.1982.4336499
Guenzer, C. S., Allas, R. G., Campbell, A. B., Kidd, J. M., Petersen, E. L., Seeman, N., Wolicki, E. A. (1980) Single Event Upsets in RAMs Induced by Protons at 4.2 GeV and Protons and Neutrons below 100 MeV. IEEE Transactions on Nuclear Science, 27 (6) 1485-1489 doi:10.1109/tns.1980.4331056
Myers, David K. (1977) Ionizing Radiation Effects on Various Commercial NMOS Microprocessors. IEEE Transactions on Nuclear Science, 24 (6) 2169-2171 doi:10.1109/tns.1977.4329185
Petersen, E. L. (2008) Single-Event Data Analysis. IEEE Transactions on Nuclear Science, 55 (6) 2819-2841 doi:10.1109/tns.2008.2007903
Xapsos, M. A., Massenqill, L. W., Stapor, W. J., Shapiro, P., Campbell, A. B., Kerns, S. E., Fernald, K. W., Knudson, A. R. (1987) Single-Event, Enhanced Single-Event and Dose-Rate Effects with Pulsed Proton Beams. IEEE Transactions on Nuclear Science, 34 (6) 1419-1425 doi:10.1109/tns.1987.4337491
Magno, R., Nisenoff, M., Shelby, R., Kidd, J., Campbell, A. B. (1982) Alpha Induced Upsets in Josephson Tunnel Junctions. IEEE Transactions on Nuclear Science, 29 (6) 2090-2094 doi:10.1109/tns.1982.4336502
Voldman, S., Patrick, L. (1984) Alpha Particle Induced Single Event Upsets in Bipolar Static ECL Cells. IEEE Transactions on Nuclear Science, 31 (6) 1196-1200 doi:10.1109/tns.1984.4333482
 
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