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Hanes, M.H., Bartko, J., Hwang, J.-M., Rai-Choudhury, P., Leslie, S.G. (1988) Radiation-hard static induction transistor. IEEE Transactions on Nuclear Science, 35 (6) 1475-1479 doi:10.1109/23.25483

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Reference TypeJournal (article/letter/editorial)
TitleRadiation-hard static induction transistor
JournalIEEE Transactions on Nuclear Science
AuthorsHanes, M.H.Author
Bartko, J.Author
Hwang, J.-M.Author
Rai-Choudhury, P.Author
Leslie, S.G.Author
Year1988Volume35
Issue6
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
DOIdoi:10.1109/23.25483Search in ResearchGate
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Mindat Ref. ID15572014Long-form Identifiermindat:1:5:15572014:7
GUID0
Full ReferenceHanes, M.H., Bartko, J., Hwang, J.-M., Rai-Choudhury, P., Leslie, S.G. (1988) Radiation-hard static induction transistor. IEEE Transactions on Nuclear Science, 35 (6) 1475-1479 doi:10.1109/23.25483
Plain TextHanes, M.H., Bartko, J., Hwang, J.-M., Rai-Choudhury, P., Leslie, S.G. (1988) Radiation-hard static induction transistor. IEEE Transactions on Nuclear Science, 35 (6) 1475-1479 doi:10.1109/23.25483
In(1988, December) IEEE Transactions on Nuclear Science Vol. 35 (6) Institute of Electrical and Electronics Engineers (IEEE)

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Palkuti, Leslie J., Pryor, Richard (1976) Radiation-Hard CMOS/SOS Standard Cell Circuits. IEEE Transactions on Nuclear Science, 23 (6) 1715-1719 doi:10.1109/tns.1976.4328567
Long, D. M., Baer, R. (1967) A New Radiation-Hard MOS Transistor. IEEE Transactions on Nuclear Science, 14 (6) 303-304 doi:10.1109/tns.1967.4324811
(1988) 1988 IEEE Annual Conference on Nuclear and Space Radiation Effects Conference. IEEE Transactions on Nuclear Science, 35 (6) doi:10.1109/23.25429
Bartko, J., Sauvageot, Robert E. (1967) Hardness of a Dielectric Switch to Ionizing Radiation. IEEE Transactions on Nuclear Science, 14 (6) 217-220 doi:10.1109/tns.1967.4324796
Liu, S.T., Lai, J., Fechner, P., Holt, M. (1989) ELO SOI technology for radiation hard devices. IEEE Transactions on Nuclear Science, 36 (6) 2182-2186 doi:10.1109/23.45422
Redman-White, W., Dunn, T.R., Lucas, D.R., Smithers, P.A., Winchcombe, S.A. (1988) A radiation hard frequency reference IC. IEEE Transactions on Nuclear Science, 35 (6) 1368-1371 doi:10.1109/23.25466
Berger, R. A., Azarewicz, J. L. (1975) Packaging Effects on Transistor Radiation Response. IEEE Transactions on Nuclear Science, 22 (6) 2568-2572 doi:10.1109/tns.1975.4328169
Coulon, J.-P. (1988) FASTBUS logic analyzer. IEEE Transactions on Nuclear Science, 35 (1) 292-294 doi:10.1109/23.12727
Killiany, J. M. (1977) Low-Temperature Radiation Damage Effects in a Room-Temperature Radiation-Hard Surface Channel CCD. IEEE Transactions on Nuclear Science, 24 (6) 2194-2198 doi:10.1109/tns.1977.4329191
Palkuti, L.J., Ling, P., Leonov, P., Kawayoshi, H., Ormond, R., Yuan, J. (1988) Radiation response of CMOS/SOI devices formed by wafer bond and etchback. IEEE Transactions on Nuclear Science, 35 (6) 1653-1656 doi:10.1109/23.25515
Yuan, J. H., Harari, E. (1977) High Performance Radiation Hard CMOS/SOS Technology. IEEE Transactions on Nuclear Science, 24 (6) 2199-2204 doi:10.1109/tns.1977.4329192
 
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