Fernandes, Isabela Cristina, Hadich, Tayan Vieira, Amorim, Milena Kowalczuk Manosso, Turri, Rafael Gustavo, Rangel, Elidiane C., Dias da Silva, José Humberto, Durrant, Steven F. (2018) Structural and optical properties of a-C:H:O:Cl and a-C:H:Si:O:Cl films obtained by Plasma Enhanced Chemical Vapor Deposition. Materials Chemistry and Physics, 214. 277-284 doi:10.1016/j.matchemphys.2018.04.097
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Structural and optical properties of a-C:H:O:Cl and a-C:H:Si:O:Cl films obtained by Plasma Enhanced Chemical Vapor Deposition | ||
Journal | Materials Chemistry and Physics | ||
Authors | Fernandes, Isabela Cristina | Author | |
Hadich, Tayan Vieira | Author | ||
Amorim, Milena Kowalczuk Manosso | Author | ||
Turri, Rafael Gustavo | Author | ||
Rangel, Elidiane C. | Author | ||
Dias da Silva, José Humberto | Author | ||
Durrant, Steven F. | Author | ||
Year | 2018 (August) | Volume | 214 |
Publisher | Elsevier BV | ||
DOI | doi:10.1016/j.matchemphys.2018.04.097Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 3064536 | Long-form Identifier | mindat:1:5:3064536:3 |
GUID | 0 | ||
Full Reference | Fernandes, Isabela Cristina, Hadich, Tayan Vieira, Amorim, Milena Kowalczuk Manosso, Turri, Rafael Gustavo, Rangel, Elidiane C., Dias da Silva, José Humberto, Durrant, Steven F. (2018) Structural and optical properties of a-C:H:O:Cl and a-C:H:Si:O:Cl films obtained by Plasma Enhanced Chemical Vapor Deposition. Materials Chemistry and Physics, 214. 277-284 doi:10.1016/j.matchemphys.2018.04.097 | ||
Plain Text | Fernandes, Isabela Cristina, Hadich, Tayan Vieira, Amorim, Milena Kowalczuk Manosso, Turri, Rafael Gustavo, Rangel, Elidiane C., Dias da Silva, José Humberto, Durrant, Steven F. (2018) Structural and optical properties of a-C:H:O:Cl and a-C:H:Si:O:Cl films obtained by Plasma Enhanced Chemical Vapor Deposition. Materials Chemistry and Physics, 214. 277-284 doi:10.1016/j.matchemphys.2018.04.097 | ||
In | (2018) Materials Chemistry and Physics Vol. 214. Elsevier BV |
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