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Dendooven, Jolien, Pulinthanathu Sree, Sreeprasanth, De Keyser, Koen, Deduytsche, Davy, Martens, Johan A., Ludwig, Karl F., Detavernier, Christophe (2011) In Situ X-ray Fluorescence Measurements During Atomic Layer Deposition: Nucleation and Growth of TiO2 on Planar Substrates and in Nanoporous Films. The Journal of Physical Chemistry C, 115 (14). 6605-6610 doi:10.1021/jp111314b

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Reference TypeJournal (article/letter/editorial)
TitleIn Situ X-ray Fluorescence Measurements During Atomic Layer Deposition: Nucleation and Growth of TiO2 on Planar Substrates and in Nanoporous Films
JournalThe Journal of Physical Chemistry C
AuthorsDendooven, JolienAuthor
Pulinthanathu Sree, SreeprasanthAuthor
De Keyser, KoenAuthor
Deduytsche, DavyAuthor
Martens, Johan A.Author
Ludwig, Karl F.Author
Detavernier, ChristopheAuthor
Year2011 (April 14)Volume115
Issue14
PublisherAmerican Chemical Society (ACS)
DOIdoi:10.1021/jp111314bSearch in ResearchGate
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Mindat Ref. ID3904444Long-form Identifiermindat:1:5:3904444:2
GUID0
Full ReferenceDendooven, Jolien, Pulinthanathu Sree, Sreeprasanth, De Keyser, Koen, Deduytsche, Davy, Martens, Johan A., Ludwig, Karl F., Detavernier, Christophe (2011) In Situ X-ray Fluorescence Measurements During Atomic Layer Deposition: Nucleation and Growth of TiO2 on Planar Substrates and in Nanoporous Films. The Journal of Physical Chemistry C, 115 (14). 6605-6610 doi:10.1021/jp111314b
Plain TextDendooven, Jolien, Pulinthanathu Sree, Sreeprasanth, De Keyser, Koen, Deduytsche, Davy, Martens, Johan A., Ludwig, Karl F., Detavernier, Christophe (2011) In Situ X-ray Fluorescence Measurements During Atomic Layer Deposition: Nucleation and Growth of TiO2 on Planar Substrates and in Nanoporous Films. The Journal of Physical Chemistry C, 115 (14). 6605-6610 doi:10.1021/jp111314b
In(2011, April) The Journal of Physical Chemistry C Vol. 115 (14) American Chemical Society (ACS)

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