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Martorana, A., Longo, A, d'Acapito, F., Maurizio, C., Cattaruzza, E., Gonella, F. (2001) Treatment of grazing-incidence small-angle X-ray scattering data taken above the critical angle. Journal of Applied Crystallography, 34 (2). 152-156 doi:10.1107/s0021889801001157

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Reference TypeJournal (article/letter/editorial)
TitleTreatment of grazing-incidence small-angle X-ray scattering data taken above the critical angle
JournalJournal of Applied Crystallography
AuthorsMartorana, A.Author
Longo, AAuthor
d'Acapito, F.Author
Maurizio, C.Author
Cattaruzza, E.Author
Gonella, F.Author
Year2001 (April 1)Volume34
Issue2
PublisherInternational Union of Crystallography (IUCr)
DOIdoi:10.1107/s0021889801001157Search in ResearchGate
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Mindat Ref. ID4667257Long-form Identifiermindat:1:5:4667257:1
GUID0
Full ReferenceMartorana, A., Longo, A, d'Acapito, F., Maurizio, C., Cattaruzza, E., Gonella, F. (2001) Treatment of grazing-incidence small-angle X-ray scattering data taken above the critical angle. Journal of Applied Crystallography, 34 (2). 152-156 doi:10.1107/s0021889801001157
Plain TextMartorana, A., Longo, A, d'Acapito, F., Maurizio, C., Cattaruzza, E., Gonella, F. (2001) Treatment of grazing-incidence small-angle X-ray scattering data taken above the critical angle. Journal of Applied Crystallography, 34 (2). 152-156 doi:10.1107/s0021889801001157
In(2001, April) Journal of Applied Crystallography Vol. 34 (2) International Union of Crystallography (IUCr)

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Maurizio, C., Longo, A., Martorana, A., Cattaruzza, E., D'Acapito, F., Gonella, F., de Julian, C., Mattei, G., Mazzoldi, P., Padovani, S., Boesecke, P. (2003) Grazing-incidence small-angle X-ray scattering and X-ray diffraction from magnetic clusters obtained by Co + Ni sequential ion implantation in silica. Journal of Applied Crystallography, 36 (3). 732-735 doi:10.1107/s0021889803006137
d'Acapito, Francesco, Maurizio, Chiara, Gonella, Francesco, Cattaruzza, Elti, Mattei, Giovanni, Mondelli, Claudia, Longo, Alessandro, Martorana, Antonino (2004) On the use of grazing-incidence small-angle X-ray scattering (GISAXS) in the morphological study of ion-implanted materials. Journal of Synchrotron Radiation, 11 (3). 272-277 doi:10.1107/s0909049504002523
Cattaruzza, E., d'Acapito, F., Gonella, F., Longo, A., Martorana, A., Mattei, G., Maurizio, C., Thiaudière, D. (2000) GISAXS study of Cu–Ni alloy clusters obtained by double ion implantation in silicate glasses. Journal of Applied Crystallography, 33 (3). 740-743 doi:10.1107/s0021889800099878
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Lazzari, R., Renaud, G., Leroy, F. (2005) Grazing incidence small angle X-ray scattering from nanoparticles: beyond classical analysis approximations. Acta Crystallographica Section A Foundations of Crystallography, 61. doi:10.1107/s0108767305082607
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