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d'Acapito, Francesco, Maurizio, Chiara, Gonella, Francesco, Cattaruzza, Elti, Mattei, Giovanni, Mondelli, Claudia, Longo, Alessandro, Martorana, Antonino (2004) On the use of grazing-incidence small-angle X-ray scattering (GISAXS) in the morphological study of ion-implanted materials. Journal of Synchrotron Radiation, 11 (3). 272-277 doi:10.1107/s0909049504002523

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Reference TypeJournal (article/letter/editorial)
TitleOn the use of grazing-incidence small-angle X-ray scattering (GISAXS) in the morphological study of ion-implanted materials
JournalJournal of Synchrotron Radiation
Authorsd'Acapito, FrancescoAuthor
Maurizio, ChiaraAuthor
Gonella, FrancescoAuthor
Cattaruzza, EltiAuthor
Mattei, GiovanniAuthor
Mondelli, ClaudiaAuthor
Longo, AlessandroAuthor
Martorana, AntoninoAuthor
Year2004 (May 1)Volume11
Issue3
PublisherInternational Union of Crystallography (IUCr)
DOIdoi:10.1107/s0909049504002523Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID8484913Long-form Identifiermindat:1:5:8484913:9
GUID0
Full Referenced'Acapito, Francesco, Maurizio, Chiara, Gonella, Francesco, Cattaruzza, Elti, Mattei, Giovanni, Mondelli, Claudia, Longo, Alessandro, Martorana, Antonino (2004) On the use of grazing-incidence small-angle X-ray scattering (GISAXS) in the morphological study of ion-implanted materials. Journal of Synchrotron Radiation, 11 (3). 272-277 doi:10.1107/s0909049504002523
Plain Textd'Acapito, Francesco, Maurizio, Chiara, Gonella, Francesco, Cattaruzza, Elti, Mattei, Giovanni, Mondelli, Claudia, Longo, Alessandro, Martorana, Antonino (2004) On the use of grazing-incidence small-angle X-ray scattering (GISAXS) in the morphological study of ion-implanted materials. Journal of Synchrotron Radiation, 11 (3). 272-277 doi:10.1107/s0909049504002523
In(2004, May) Journal of Synchrotron Radiation Vol. 11 (3) International Union of Crystallography (IUCr)

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Martorana, A., Longo, A, d'Acapito, F., Maurizio, C., Cattaruzza, E., Gonella, F. (2001) Treatment of grazing-incidence small-angle X-ray scattering data taken above the critical angle. Journal of Applied Crystallography, 34 (2). 152-156 doi:10.1107/s0021889801001157
Maurizio, C., Longo, A., Martorana, A., Cattaruzza, E., D'Acapito, F., Gonella, F., de Julian, C., Mattei, G., Mazzoldi, P., Padovani, S., Boesecke, P. (2003) Grazing-incidence small-angle X-ray scattering and X-ray diffraction from magnetic clusters obtained by Co + Ni sequential ion implantation in silica. Journal of Applied Crystallography, 36 (3). 732-735 doi:10.1107/s0021889803006137
Cattaruzza, E., d'Acapito, F., Gonella, F., Longo, A., Martorana, A., Mattei, G., Maurizio, C., Thiaudière, D. (2000) GISAXS study of Cu–Ni alloy clusters obtained by double ion implantation in silicate glasses. Journal of Applied Crystallography, 33 (3). 740-743 doi:10.1107/s0021889800099878
Longo, Alessandro, Balerna, Antonella, d'Acapito, Francesco, D'Anca, Fabio, Giannici, Francesco, Liotta, Leonarda F., Pantaleo, Giuseppe, Martorana, Antonino (2005) A new cell for the study ofin situchemical reactions using X-ray absorption spectroscopy. Journal of Synchrotron Radiation, 12 (4). 499-505 doi:10.1107/s090904950501143x
Trave, Enrico, Back, Michele, Cattaruzza, Elti, Gonella, Francesco, Enrichi, Francesco, Cesca, Tiziana, Kalinic, Boris, Scian, Carlo, Bello, Valentina, Maurizio, Chiara, Mattei, Giovanni (2018) Control of silver clustering for broadband Er3+ luminescence sensitization in Er and Ag co-implanted silica. Journal of Luminescence, 197. 104-111 doi:10.1016/j.jlumin.2018.01.025
Zontone, Federico, D'Acapito, Francesco, Gonella, Francesco (1999) Synchrotron radiation glancing incidence X-ray diffraction: a tool for structural investigations of ion implanted glasses. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 147 (1). 416-421 doi:10.1016/s0168-583x(98)90569-9
Gonella, F, Cattaruzza, E, Battaglin, G, D'Acapito, F, Sada, C, Mazzoldi, P, Maurizio, C, Mattei, G, Martorana, A, Longo, A, Zontone, F (2001) Double implantation in silica glass for metal cluster composite formation: a study by synchrotron radiation techniques. Journal of Non-Crystalline Solids, 280 (1) 241-248 doi:10.1016/s0022-3093(00)00392-6
Bertoncello, R., Battaglin, G., Cattaruzza, Elti, Gonella, Francesco, Mattei, G., Mazzoldi, P., Trivillin, F. (1995) Chemical Interactions in Titanium-Implanted Fused Silica. Materials Science Forum, 195. 49-54 doi:10.4028/www.scientific.net/msf.195.49
d'Acapito, Francesco, Zontone, Federico (1999) Grazing-incidence X-ray diffraction in the study of metallic clusters buried in glass obtained by ion implantation. Journal of Applied Crystallography, 32 (2). 234-240 doi:10.1107/s0021889898012151
Chiara, Alessandro, Canu, Giovanna, Longo, Alessandro, Pipitone, Candida, Martorana, Antonino, Giannici, Francesco (2022) Solid-state compatibility of Ca:LaNbO4 with perovskite cathodes: Evidences from X-ray microspectroscopy. Electrochimica Acta, 401. 139495pp. doi:10.1016/j.electacta.2021.139495
Canu, Giovanna, Giannici, Francesco, Chiara, Alessandro, Confalonieri, Giorgia, Longo, Alessandro, Buscaglia, Maria Teresa, Dapiaggi, Monica, Buscaglia, Vincenzo, Martorana, Antonino (2021) Characterisation of scheelite LaW0.16Nb0.84O4.08 ion conductor by combined synchrotron techniques: Structure, W oxidation state and interdiffusion. Journal of Alloys and Compounds, 857. 157532pp. doi:10.1016/j.jallcom.2020.157532
 
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