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Cooper, R. A., Lerner, E. (1968) Four Point Mercury Contact Probe for Electrical Resistivity Measurements of Thin Films. Review of Scientific Instruments, 39 (8). 1207-1208 doi:10.1063/1.1683619

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Reference TypeJournal (article/letter/editorial)
TitleFour Point Mercury Contact Probe for Electrical Resistivity Measurements of Thin Films
JournalReview of Scientific Instruments
AuthorsCooper, R. A.Author
Lerner, E.Author
Year1968 (August)Volume39
Issue8
PublisherAIP Publishing
DOIdoi:10.1063/1.1683619Search in ResearchGate
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Mindat Ref. ID4810114Long-form Identifiermindat:1:5:4810114:7
GUID0
Full ReferenceCooper, R. A., Lerner, E. (1968) Four Point Mercury Contact Probe for Electrical Resistivity Measurements of Thin Films. Review of Scientific Instruments, 39 (8). 1207-1208 doi:10.1063/1.1683619
Plain TextCooper, R. A., Lerner, E. (1968) Four Point Mercury Contact Probe for Electrical Resistivity Measurements of Thin Films. Review of Scientific Instruments, 39 (8). 1207-1208 doi:10.1063/1.1683619
In(1968, August) Review of Scientific Instruments Vol. 39 (8) AIP Publishing

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Swartzendruber, L. J., Ulmer, F. H., Coleman, J. A. (1968) Direct Reading Instrument for Silicon and Germanium Four‐Probe Resistivity Measurements. Review of Scientific Instruments, 39 (12). 1858-1863 doi:10.1063/1.1683255
Cybriwsky, Alex (1966) Wide Temperature Range Four Point Probe Device for Measuring Electrical Resistivity. Review of Scientific Instruments, 37 (7). 961-962 doi:10.1063/1.1720376
Hammer, R. (1970) A Mercury Contact Probe for MOS Measurements on Oxidized Silicon. Review of Scientific Instruments, 41 (2). 292-293 doi:10.1063/1.1684503
Cahen, David, Hahn, J. R., Anderson, James R. (1973) A four probe cell for rapid resistivity measurements. Review of Scientific Instruments, 44 (11). 1567-1568 doi:10.1063/1.1686001
Dew‐Hughes, D., Jones, A. H., Brock, G. E. (1959) Improved Automatic Four‐Point Resistivity Probe. Review of Scientific Instruments, 30 (10). 920-922 doi:10.1063/1.1716383
Morton, S. A., Turton, J., Greig, D. (1995) A four‐point probe to measure the electrical resistivity of alloys under UHV conditions. Review of Scientific Instruments, 66 (7). 3917-3920 doi:10.1063/1.1145394
Kennedy, John K. (1962) Four‐Point Probe for Measuring the Resistivity of Small Samples. Review of Scientific Instruments, 33 (7). 773-775 doi:10.1063/1.1717968
Keywell, Frank, Dorosheski, George (1960) Measurement of the Sheet Resistivity of a Square Wafer with a Square Four‐Point Probe. Review of Scientific Instruments, 31 (8). 833-837 doi:10.1063/1.1717065
Kokabi, H. R., Provost, J., Desgardin, G. (1993) A new device for electrical resistivity measurements as a function of temperature (86–700 K) under controlled atmosphere by the four‐probe method. Review of Scientific Instruments, 64 (6). 1549-1553 doi:10.1063/1.1144025
Herlach, F. (1968) Method for Resistivity Measurements in Megagauss Fields. Review of Scientific Instruments, 39 (3). 405-406 doi:10.1063/1.1683389
Paulnack, C. L. (1964) Technique for Two‐ and Four‐Point Resistivity Measurements on GaAs. Review of Scientific Instruments, 35 (12). 1715-1717 doi:10.1063/1.1719288
 
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