Watch the Dallas Symposium LIVE, and fundraiser auction
Ticket proceeds support mindat.org! - click here...
Log InRegister
Quick Links : The Mindat ManualThe Rock H. Currier Digital LibraryMindat Newsletter [Free Download]
Home PageAbout MindatThe Mindat ManualHistory of MindatCopyright StatusWho We AreContact UsAdvertise on Mindat
Donate to MindatCorporate SponsorshipSponsor a PageSponsored PagesMindat AdvertisersAdvertise on Mindat
Learning CenterWhat is a mineral?The most common minerals on earthInformation for EducatorsMindat ArticlesThe ElementsThe Rock H. Currier Digital LibraryGeologic Time
Minerals by PropertiesMinerals by ChemistryAdvanced Locality SearchRandom MineralRandom LocalitySearch by minIDLocalities Near MeSearch ArticlesSearch GlossaryMore Search Options
Search For:
Mineral Name:
Locality Name:
Keyword(s):
 
The Mindat ManualAdd a New PhotoRate PhotosLocality Edit ReportCoordinate Completion ReportAdd Glossary Item
Mining CompaniesStatisticsUsersMineral MuseumsClubs & OrganizationsMineral Shows & EventsThe Mindat DirectoryDevice SettingsThe Mineral Quiz
Photo SearchPhoto GalleriesSearch by ColorNew Photos TodayNew Photos YesterdayMembers' Photo GalleriesPast Photo of the Day GalleryPhotography

Kokabi, H. R., Provost, J., Desgardin, G. (1993) A new device for electrical resistivity measurements as a function of temperature (86–700 K) under controlled atmosphere by the four‐probe method. Review of Scientific Instruments, 64 (6). 1549-1553 doi:10.1063/1.1144025

Advanced
   -   Only viewable:
Reference TypeJournal (article/letter/editorial)
TitleA new device for electrical resistivity measurements as a function of temperature (86–700 K) under controlled atmosphere by the four‐probe method
JournalReview of Scientific Instruments
AuthorsKokabi, H. R.Author
Provost, J.Author
Desgardin, G.Author
Year1993 (June)Volume64
Issue6
PublisherAIP Publishing
DOIdoi:10.1063/1.1144025Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID4865314Long-form Identifiermindat:1:5:4865314:5
GUID0
Full ReferenceKokabi, H. R., Provost, J., Desgardin, G. (1993) A new device for electrical resistivity measurements as a function of temperature (86–700 K) under controlled atmosphere by the four‐probe method. Review of Scientific Instruments, 64 (6). 1549-1553 doi:10.1063/1.1144025
Plain TextKokabi, H. R., Provost, J., Desgardin, G. (1993) A new device for electrical resistivity measurements as a function of temperature (86–700 K) under controlled atmosphere by the four‐probe method. Review of Scientific Instruments, 64 (6). 1549-1553 doi:10.1063/1.1144025
In(1993, June) Review of Scientific Instruments Vol. 64 (6) AIP Publishing

See Also

These are possibly similar items as determined by title/reference text matching only.

Cybriwsky, Alex (1966) Wide Temperature Range Four Point Probe Device for Measuring Electrical Resistivity. Review of Scientific Instruments, 37 (7). 961-962 doi:10.1063/1.1720376
Cooper, R. A., Lerner, E. (1968) Four Point Mercury Contact Probe for Electrical Resistivity Measurements of Thin Films. Review of Scientific Instruments, 39 (8). 1207-1208 doi:10.1063/1.1683619
Cahen, David, Hahn, J. R., Anderson, James R. (1973) A four probe cell for rapid resistivity measurements. Review of Scientific Instruments, 44 (11). 1567-1568 doi:10.1063/1.1686001
Kimura, T., Ohe, K. (1993) Emissive probe as a reference electrode in probe measurements. Review of Scientific Instruments, 64 (11). 3274-3277 doi:10.1063/1.1144473
Yoshimoto, S., Tsutsui, T., Mukai, K., Yoshinobu, J. (2011) Independently driven four-probe method for local electrical characteristics in organic thin-film transistors under controlled channel potential. Review of Scientific Instruments, 82 (9). 93902pp. doi:10.1063/1.3637489
Hottman, Steven D., Pohl, Herbert A. (1971) A Four Probe Cell for Resistivity Measurements at Temperature Independent Pressures. Review of Scientific Instruments, 42 (3). 387-388 doi:10.1063/1.1685102
Germann, R. W., Rogers, D. B. (1966) Four‐Probe Device for Accurate Measurement of Temperature Dependence of Electrical Resistivity on Small, Irregularly Shaped Single Crystals With Parallel Sides. Review of Scientific Instruments, 37 (3). 273-274 doi:10.1063/1.1720156
Morton, S. A., Turton, J., Greig, D. (1995) A four‐point probe to measure the electrical resistivity of alloys under UHV conditions. Review of Scientific Instruments, 66 (7). 3917-3920 doi:10.1063/1.1145394
Swartzendruber, L. J., Ulmer, F. H., Coleman, J. A. (1968) Direct Reading Instrument for Silicon and Germanium Four‐Probe Resistivity Measurements. Review of Scientific Instruments, 39 (12). 1858-1863 doi:10.1063/1.1683255
Braught, G., Pfister, H., Wachtel, J. (1993) An innovative, simple design for a computer‐controlled, three‐dimensional plasma probe drive system. Review of Scientific Instruments, 64 (11). 3270-3273 doi:10.1063/1.1144289
Gómez-Galván, F., Mercado-Uribe, H. (2009) Experimental device to measure the electrical and optical properties of radiochromic films as a function of temperature. Review of Scientific Instruments, 80 (6). 65103pp. doi:10.1063/1.3143565
 
and/or  
Mindat.org is an outreach project of the Hudson Institute of Mineralogy, a 501(c)(3) not-for-profit organization.
Copyright © mindat.org and the Hudson Institute of Mineralogy 1993-2025, except where stated. Most political location boundaries are © OpenStreetMap contributors. Mindat.org relies on the contributions of thousands of members and supporters. Founded in 2000 by Jolyon Ralph.
To cite: Ralph, J., Von Bargen, D., Martynov, P., Zhang, J., Que, X., Prabhu, A., Morrison, S. M., Li, W., Chen, W., & Ma, X. (2025). Mindat.org: The open access mineralogy database to accelerate data-intensive geoscience research. American Mineralogist, 110(6), 833–844. doi:10.2138/am-2024-9486.
Privacy Policy - Terms & Conditions - Contact Us / DMCA issues - Report a bug/vulnerability Current server date and time: August 21, 2025 08:26:01
Go to top of page