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Kabius, B., Allen, C.W., Miller, D.J. (2002) Aberration Correction for Analytical In Situ TEM – the NTEAM Concept. Microscopy and Microanalysis, 8. 418-419 doi:10.1017/s1431927602100535

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Reference TypeJournal (article/letter/editorial)
TitleAberration Correction for Analytical In Situ TEM – the NTEAM Concept.
JournalMicroscopy and Microanalysis
AuthorsKabius, B.Author
Allen, C.W.Author
Miller, D.J.Author
Year2002 (August)Volume8
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1431927602100535Search in ResearchGate
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Mindat Ref. ID4814986Long-form Identifiermindat:1:5:4814986:4
GUID0
Full ReferenceKabius, B., Allen, C.W., Miller, D.J. (2002) Aberration Correction for Analytical In Situ TEM – the NTEAM Concept. Microscopy and Microanalysis, 8. 418-419 doi:10.1017/s1431927602100535
Plain TextKabius, B., Allen, C.W., Miller, D.J. (2002) Aberration Correction for Analytical In Situ TEM – the NTEAM Concept. Microscopy and Microanalysis, 8. 418-419 doi:10.1017/s1431927602100535
In(2002) Microscopy and Microanalysis Vol. 8. Cambridge University Press (CUP)

See Also

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Kabius, B (2008) Benefits of Aberration Correction for Ultra-Fast TEM Experiments. Microscopy and Microanalysis, 14. 492-493 doi:10.1017/s1431927608086868
Wen, J.G., Miller, D.J., Cook, R.E., Zaluzec, N.J. (2014) Amplitude Contrast Imaging: High Resolution Electron Microscopy Using a Spherical and Chromatic Aberration Corrected TEM. Microscopy and Microanalysis, 20. 942-943 doi:10.1017/s1431927614006436
Chen, J. H., Urban, K., Kabius, B., Lentzen, M., Jansen, J., Zandbergen, H. W. (2002) Atomic imaging in aberration-corrected HRTEM with application to Al alloys. Microscopy and Microanalysis, 8. 468-469 doi:10.1017/s1431927602105289
Gao, W., Wen, J., Miller, D.J., Zuo, J.-M. (2013) Electron Imaging of Interfacial Oxygen by Aberration Corrected TEM, the Possibility and Scientific Opportunities. Microscopy and Microanalysis, 19. 1692-1693 doi:10.1017/s1431927613010453
Wang, Zhong Lin (ZL) (2002) Scanning Probe Microscopy in TEM : an In-situ Approach for Nano-scale Property Measurements. Microscopy and Microanalysis, 8. 300-301 doi:10.1017/s1431927602100821
Lazar, S, Etheridge, J, Dwyer, C, Freitag, B, Botton, GA (2010) Applications of spherical aberration correction in STEM and TEM. Microscopy and Microanalysis, 16. 68-69 doi:10.1017/s1431927610058034
Wacey, D, Saunders, M, Kilburn, MR (2010) NanoSIMS and TEM: Complementary Techniques in the Search for the Earliest Life on Earth. Microscopy and Microanalysis, 16. 418-419 doi:10.1017/s1431927610054267
Kempshall, B.W., Giannuzzi, L.A. (2002) In-Situ Lift-Out FIB Specimen Preparation for TEM of Magnetic Materials. Microscopy and Microanalysis, 8. 390-391 doi:10.1017/s1431927602100717
Mülle, Heiko, Uhlemann, Stephan, Haider, Maximilian (2002) Benefits and Possibilities of Cc–Correction for TEM / STEM. Microscopy and Microanalysis, 8. 12-13 doi:10.1017/s1431927602101498
Schroeder, W.A., Berger, J.A., Nicholls, A.W., Zaluzec, N.J., Miller, D.J. (2012) Photoemission Processes for Ultrafast TEM. Microscopy and Microanalysis, 18. 582-583 doi:10.1017/s143192761200476x
Miller, B, Robertson, I (2006) Twin Boundary Interactions in FCC Metals Observed Using the In-situ TEM Deformation Technique. Microscopy and Microanalysis, 12. 936-937 doi:10.1017/s1431927606065081
 
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