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McKeegan, K D, Coath, C D, Jarzebinski, G, Kunihiro, T, Mao, P H (2005) MegaSIMS: A High Energy Secondary Ion Mass Spectrometer for the Analysis of Captured Solar Wind. Microscopy and Microanalysis, 11. doi:10.1017/s1431927605509243

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Reference TypeJournal (article/letter/editorial)
TitleMegaSIMS: A High Energy Secondary Ion Mass Spectrometer for the Analysis of Captured Solar Wind.
JournalMicroscopy and Microanalysis
AuthorsMcKeegan, K DAuthor
Coath, C DAuthor
Jarzebinski, GAuthor
Kunihiro, TAuthor
Mao, P HAuthor
Year2005 (August)Volume11
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1431927605509243Search in ResearchGate
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Mindat Ref. ID4831013Long-form Identifiermindat:1:5:4831013:4
GUID0
Full ReferenceMcKeegan, K D, Coath, C D, Jarzebinski, G, Kunihiro, T, Mao, P H (2005) MegaSIMS: A High Energy Secondary Ion Mass Spectrometer for the Analysis of Captured Solar Wind. Microscopy and Microanalysis, 11. doi:10.1017/s1431927605509243
Plain TextMcKeegan, K D, Coath, C D, Jarzebinski, G, Kunihiro, T, Mao, P H (2005) MegaSIMS: A High Energy Secondary Ion Mass Spectrometer for the Analysis of Captured Solar Wind. Microscopy and Microanalysis, 11. doi:10.1017/s1431927605509243
In(2005) Microscopy and Microanalysis Vol. 11. Cambridge University Press (CUP)

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McKeegan, K. D., Kallio, A. P. A., Heber, V. S., Jarzebinski, G., Mao, P. H., Coath, C. D., Kunihiro, T., Wiens, R. C., Nordholt, J. E., Moses, R. W., Reisenfeld, D. B., Jurewicz, A. J. G., Burnett, D. S. (2011) The Oxygen Isotopic Composition of the Sun Inferred from Captured Solar Wind. Science, 332 (6037). 1528-1532 doi:10.1126/science.1204636
Mao, Peter H., Burnett, Donald S., Coath, Christopher D., Jarzebinski, George, Kunihiro, Takuya, McKeegan, Kevin D. (2008) MegaSIMS: a SIMS/AMS hybrid for measurement of the Sun’s oxygen isotopic composition. Applied Surface Science, 255. 1461-1464 doi:10.1016/j.apsusc.2008.05.175
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Coath, C. D., Long, J. V. P. (1995) A high‐brightness duoplasmatron ion source for microprobe secondary‐ion mass spectrometry. Review of Scientific Instruments, 66 (2). 1018-1023 doi:10.1063/1.1146038
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