Watch the Dallas Symposium LIVE, and fundraiser auction
Ticket proceeds support mindat.org! - click here...
Log InRegister
Quick Links : The Mindat ManualThe Rock H. Currier Digital LibraryMindat Newsletter [Free Download]
Home PageAbout MindatThe Mindat ManualHistory of MindatCopyright StatusWho We AreContact UsAdvertise on Mindat
Donate to MindatCorporate SponsorshipSponsor a PageSponsored PagesMindat AdvertisersAdvertise on Mindat
Learning CenterWhat is a mineral?The most common minerals on earthInformation for EducatorsMindat ArticlesThe ElementsThe Rock H. Currier Digital LibraryGeologic Time
Minerals by PropertiesMinerals by ChemistryAdvanced Locality SearchRandom MineralRandom LocalitySearch by minIDLocalities Near MeSearch ArticlesSearch GlossaryMore Search Options
Search For:
Mineral Name:
Locality Name:
Keyword(s):
 
The Mindat ManualAdd a New PhotoRate PhotosLocality Edit ReportCoordinate Completion ReportAdd Glossary Item
Mining CompaniesStatisticsUsersMineral MuseumsClubs & OrganizationsMineral Shows & EventsThe Mindat DirectoryDevice SettingsThe Mineral Quiz
Photo SearchPhoto GalleriesSearch by ColorNew Photos TodayNew Photos YesterdayMembers' Photo GalleriesPast Photo of the Day GalleryPhotography

Downing, K H (2005) Performance Characterization and Improvement for CCD Cameras in Transmission Electron Microscopy. Microscopy and Microanalysis, 11. doi:10.1017/s1431927605510225

Advanced
   -   Only viewable:
Reference TypeJournal (article/letter/editorial)
TitlePerformance Characterization and Improvement for CCD Cameras in Transmission Electron Microscopy
JournalMicroscopy and Microanalysis
AuthorsDowning, K HAuthor
Year2005 (August)Volume11
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1431927605510225Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID4831418Long-form Identifiermindat:1:5:4831418:5
GUID0
Full ReferenceDowning, K H (2005) Performance Characterization and Improvement for CCD Cameras in Transmission Electron Microscopy. Microscopy and Microanalysis, 11. doi:10.1017/s1431927605510225
Plain TextDowning, K H (2005) Performance Characterization and Improvement for CCD Cameras in Transmission Electron Microscopy. Microscopy and Microanalysis, 11. doi:10.1017/s1431927605510225
In(2005) Microscopy and Microanalysis Vol. 11. Cambridge University Press (CUP)

See Also

These are possibly similar items as determined by title/reference text matching only.

Downing, Kenneth H. (1995) Progress In Design and Applications Of CCD Cameras For Electron Microscopy. Microscopy Today, 3 (10). 12-13 doi:10.1017/s1551929500065652
Downing, Kenneth H, Mooney, Paul E (2004) CCD Camera with Electron Decelerator for Intermediate Voltage Electron Microscopy. Microscopy and Microanalysis, 10. 1378-1379 doi:10.1017/s1431927604882977
O’Keefe, M A, Downing, K H, Wenk, H-R, Meisheng, H (2005) Atomic-Resolution 3D Electron Microscopy with Dynamic Diffraction. Microscopy and Microanalysis, 11. doi:10.1017/s1431927605510390
Bao, Y, Calderon, H A, Krishnan, K M (2005) Characterization of Co core Au shell Nanoparticles with Transmission Electron Microscopy. Microscopy and Microanalysis, 11. doi:10.1017/s1431927605507876
Bendersky, L, Takeuchi, I (2005) Use of Transmission Electron Microscopy in Combinatorial Use of Transmission Electron Microscopy in Combinatorial Studies of Functional Oxides. Microscopy and Microanalysis, 11. doi:10.1017/s1431927605503659
Ellisman, M H (2005) An Historical Perspective on Digital Imaging in Transmission Electron Microscopy: Looking to the Future. Microscopy and Microanalysis, 11. doi:10.1017/s1431927605510237
Fellmann, D, Banez, R, Carragher, B, Potter, C (2005) Environment Monitoring for Transmission Electron Microscopy. Microscopy and Microanalysis, 11. doi:10.1017/s1431927605508080
Tsung, L, Mollon, B, Jia, Y, Mooney, P, Mao, C, Pan, M (2008) Development of Fast CCD Cameras for in-situ Electron Microscopy. Microscopy and Microanalysis, 14. 808-809 doi:10.1017/s1431927608083591
Dobberstein, H, Homsy, O A, Morrison, D E, Thiel, B L (2005) Environmental Scanning Electron Microscopy in Transmission Mode. Microscopy and Microanalysis, 11. doi:10.1017/s1431927605507128
Cho, J–H, Cho, D–H, Lee, C–W, Kim, W–Y, Lim, S–H (2005) Characterization of Epitaxial Layer Defects in Silicon Wafers Using Focused Ion Beam and Transmission Electron Microscopy. Microscopy and Microanalysis, 11. doi:10.1017/s1431927605509000
Xie, G, Song, M, Mitsuishi, K, Furuya, K (2005) Transmission Electron Microscopy of Metal Nanodendrites Grown on Insulator Substrates by Electron-Beam-Induced Deposition. Microscopy and Microanalysis, 11. doi:10.1017/s1431927605505075
 
and/or  
Mindat.org is an outreach project of the Hudson Institute of Mineralogy, a 501(c)(3) not-for-profit organization.
Copyright © mindat.org and the Hudson Institute of Mineralogy 1993-2025, except where stated. Most political location boundaries are © OpenStreetMap contributors. Mindat.org relies on the contributions of thousands of members and supporters. Founded in 2000 by Jolyon Ralph.
To cite: Ralph, J., Von Bargen, D., Martynov, P., Zhang, J., Que, X., Prabhu, A., Morrison, S. M., Li, W., Chen, W., & Ma, X. (2025). Mindat.org: The open access mineralogy database to accelerate data-intensive geoscience research. American Mineralogist, 110(6), 833–844. doi:10.2138/am-2024-9486.
Privacy Policy - Terms & Conditions - Contact Us / DMCA issues - Report a bug/vulnerability Current server date and time: August 15, 2025 01:06:05
Go to top of page