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Gutu, T, Wu, J, Jeffreys, C, Chang, C-H, Rorrer, G, Jiao, J (2007) Dual Beam Focused Ion Beam and Transmission Electron Microscopies of Nanoscale Sectioned Diatom Frustules. Microscopy and Microanalysis, 13. doi:10.1017/s1431927607073837

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Reference TypeJournal (article/letter/editorial)
TitleDual Beam Focused Ion Beam and Transmission Electron Microscopies of Nanoscale Sectioned Diatom Frustules
JournalMicroscopy and Microanalysis
AuthorsGutu, TAuthor
Wu, JAuthor
Jeffreys, CAuthor
Chang, C-HAuthor
Rorrer, GAuthor
Jiao, JAuthor
Year2007 (August)Volume13
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1431927607073837Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID4837257Long-form Identifiermindat:1:5:4837257:8
GUID0
Full ReferenceGutu, T, Wu, J, Jeffreys, C, Chang, C-H, Rorrer, G, Jiao, J (2007) Dual Beam Focused Ion Beam and Transmission Electron Microscopies of Nanoscale Sectioned Diatom Frustules. Microscopy and Microanalysis, 13. doi:10.1017/s1431927607073837
Plain TextGutu, T, Wu, J, Jeffreys, C, Chang, C-H, Rorrer, G, Jiao, J (2007) Dual Beam Focused Ion Beam and Transmission Electron Microscopies of Nanoscale Sectioned Diatom Frustules. Microscopy and Microanalysis, 13. doi:10.1017/s1431927607073837
In(2007) Microscopy and Microanalysis Vol. 13. Cambridge University Press (CUP)

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Gutu, T, Lee, D-H, Jeffryes, C, Rorrer, GL, Chang, C-H, Jiao, J (2006) Electron Microscopy Study of Zinc Silicate Coated Diatom Frustules. Microscopy and Microanalysis, 12. 730-731 doi:10.1017/s1431927606062982
Gutu, T, Jiao, J, Jeffryes, C, Chang, C-H, Rorrer, GL (2008) Electron Microscopy Analysis of CdS Coated Diatom Cell Walls. Microscopy and Microanalysis, 14. 360-361 doi:10.1017/s1431927608084006
Gutu, T, Gale, DK, Wang, W, Chang, C-H, Rorrer, GL, Jiao, J (2009) Electron Microscopy and Raman Spectroscopy Characterization of Nanoparticle Coated Diatom Biosilica. Microscopy and Microanalysis, 15. 1278-1279 doi:10.1017/s1431927609095014
Gutu, T, Dong, L, Jiao, J, Rorrer, G L, Chang, C-H, Jeffryes, C, Tian, Q (2005) Characterization of Silicon-Germanium Oxide Nanocomposites Fabricated by the Marine Diatom Nitzschia Frustulum. Microscopy and Microanalysis, 11. doi:10.1017/s1431927605507566
Perrey, C. R., Carter, C. B., Kotula, P. G., Michael, J. R. (2002) Characterization of Nanoparticle Films and Structures Using Focused Ion Beam Milling and Transmission Electron Microscopy. Microscopy and Microanalysis, 8. 1144-1145 doi:10.1017/s1431927602103795
Bourne, G (2007) Focused Ion Beam Scanning Electron Microscope at the Major Analytical Instrumentation Center. Microscopy and Microanalysis, 13. doi:10.1017/s1431927607078956
Cho, J–H, Cho, D–H, Lee, C–W, Kim, W–Y, Lim, S–H (2005) Characterization of Epitaxial Layer Defects in Silicon Wafers Using Focused Ion Beam and Transmission Electron Microscopy. Microscopy and Microanalysis, 11. doi:10.1017/s1431927605509000
Stokes, D, Vystavel, T, Wilhelmi, O (2007) Nanolithography of Electrically Insulating Materials Using Simultaneous Defocused Primary Electron Beam and Focused Ion Beam Irradiation. Microscopy and Microanalysis, 13. doi:10.1017/s1431927607077367
Wu, J, Dong, L, Petty, J, Pan, C, Jiao, J (2005) Fabrication of Metal-Gated Carbon Nanotube Emitter Arrays Assisted by Focused Ion Beam and Chemical Vapor Deposition. Microscopy and Microanalysis, 11. doi:10.1017/s1431927605507074
Wu, J, Gutu, T, Eastman, M, Wyse, M, Kim, S-M, Zhang, Y, Teo, KB K, Milne, WI, Jiao, J (2007) Electron Microscopy and Spectroscopy Characterization of As-Made CNTs. Microscopy and Microanalysis, 13. doi:10.1017/s1431927607074211
Choi, T, Kang, B, Poulikakos, D (2007) Focused Ion Beam in Thermal Science and Engineering. Microscopy and Microanalysis, 13. doi:10.1017/s143192760707907x
 
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