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Haider, M, Hartel, P, Müller, H, Uhlemann, S, Zach, J (2009) Development of Correctors: From O. Scherzer to TEAM. Microscopy and Microanalysis, 15. 150-151 doi:10.1017/s1431927609096275

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Reference TypeJournal (article/letter/editorial)
TitleDevelopment of Correctors: From O. Scherzer to TEAM
JournalMicroscopy and Microanalysis
AuthorsHaider, MAuthor
Hartel, PAuthor
Müller, HAuthor
Uhlemann, SAuthor
Zach, JAuthor
Year2009 (July)Volume15
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1431927609096275Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID4846888Long-form Identifiermindat:1:5:4846888:4
GUID0
Full ReferenceHaider, M, Hartel, P, Müller, H, Uhlemann, S, Zach, J (2009) Development of Correctors: From O. Scherzer to TEAM. Microscopy and Microanalysis, 15. 150-151 doi:10.1017/s1431927609096275
Plain TextHaider, M, Hartel, P, Müller, H, Uhlemann, S, Zach, J (2009) Development of Correctors: From O. Scherzer to TEAM. Microscopy and Microanalysis, 15. 150-151 doi:10.1017/s1431927609096275
In(2009) Microscopy and Microanalysis Vol. 15. Cambridge University Press (CUP)

See Also

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Hartel, P, Müller, H, Uhlemann, S, Haider, M (2007) First Experimental Results with Advanced Hexapole Cs-Correctors. Microscopy and Microanalysis, 13. doi:10.1017/s1431927607080026
Haider, M, Hartel, P, Loebau, U, Hoeschen, R, Müller, H, Uhlemann, S, Kahl, F, Zach, F (2008) Progress on the Development of a Cc/Cs Corrector for TEAM. Microscopy and Microanalysis, 14. 800-801 doi:10.1017/s1431927608086960
Hartel, P, Müller, H, Uhlemann, S, Zach, J, Haider, M (2010) Benefits of Simultaneous Cc- and Cs-Correction. Microscopy and Microanalysis, 16. 114-115 doi:10.1017/s1431927610055133
Müller, Heiko, Uhlemann, Stephan, Hartel, Peter, Zach, Joachim, Haider, Max (2014) Overview of Commercially Available CEOS Hexapole-type Aberration Correctors. Microscopy and Microanalysis, 20. 934-935 doi:10.1017/s1431927614006394
Kabius, B, Hartel, P, Haider, M, Müller, H, Uhlemann, S, Loebau, U, Zach, J (2009) First Application of Cc Corrected Imaging for High-Resolution and Energy-Filtered TEM. Microscopy and Microanalysis, 15. 1456-1457 doi:10.1017/s1431927609098547
Haider, M., Hartel, P., Müller, H., Uhlemann, S., Zach, J. (2010) Information Transfer in a TEM Corrected for Spherical and Chromatic Aberration. Microscopy and Microanalysis, 16 (4). 393-408 doi:10.1017/s1431927610013498
Uhlemann, S., Muller, H., Hartel, P., Zach, J., Haider, M. (2013) Instrumental Resolution Limit By Magnetic Thermal Noise From Conductive Parts. Microscopy and Microanalysis, 19. 598-599 doi:10.1017/s1431927613004984
Maβmann, I, Uhlemann, S, Müller, H, Hartel, P, Zach, J, Haider, M, Taniguchi, Y, Hoyle, D, Herring, R (2011) Realization of the First Aplanatic Transmission Electron Microscope. Microscopy and Microanalysis, 17. 1270-1271 doi:10.1017/s1431927611007227
Mueller, H., Uhlemann, S., Zach, J., Hartel, P., Haider, M. (2013) Assessment of the TEM Information Limit by Means of Tilted Illumination. Microscopy and Microanalysis, 19. 612-613 doi:10.1017/s1431927613005059
Haider, M., Hartel, P., Müller, H., Uhlemann, S., Zach, J. (2009) Current and future aberration correctors for the improvement of resolution in electron microscopy. Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences, 367 (1903) 3665-3682 doi:10.1098/rsta.2009.0121
Hartel, P, Müller, H, Uhlemann, S, Haider, M (2007) Experimental Set-up of an Advanced Hexapole Cs-Corrector. Microscopy and Microanalysis, 13. doi:10.1017/s1431927607072777
 
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