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Mueller, H., Uhlemann, S., Zach, J., Hartel, P., Haider, M. (2013) Assessment of the TEM Information Limit by Means of Tilted Illumination. Microscopy and Microanalysis, 19. 612-613 doi:10.1017/s1431927613005059

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Reference TypeJournal (article/letter/editorial)
TitleAssessment of the TEM Information Limit by Means of Tilted Illumination
JournalMicroscopy and Microanalysis
AuthorsMueller, H.Author
Uhlemann, S.Author
Zach, J.Author
Hartel, P.Author
Haider, M.Author
Year2013 (August)Volume19
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1431927613005059Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID4862883Long-form Identifiermindat:1:5:4862883:9
GUID0
Full ReferenceMueller, H., Uhlemann, S., Zach, J., Hartel, P., Haider, M. (2013) Assessment of the TEM Information Limit by Means of Tilted Illumination. Microscopy and Microanalysis, 19. 612-613 doi:10.1017/s1431927613005059
Plain TextMueller, H., Uhlemann, S., Zach, J., Hartel, P., Haider, M. (2013) Assessment of the TEM Information Limit by Means of Tilted Illumination. Microscopy and Microanalysis, 19. 612-613 doi:10.1017/s1431927613005059
In(2013) Microscopy and Microanalysis Vol. 19. Cambridge University Press (CUP)

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Uhlemann, S., Muller, H., Hartel, P., Zach, J., Haider, M. (2013) Instrumental Resolution Limit By Magnetic Thermal Noise From Conductive Parts. Microscopy and Microanalysis, 19. 598-599 doi:10.1017/s1431927613004984
Haider, M., Mueller, H., Hartel, P. (2013) High-Resolution TEM/STEM by means of advanced Instrumentation. Microscopy and Microanalysis, 19. 304-305 doi:10.1017/s1431927613003516
Haider, M., Hartel, P., Müller, H., Uhlemann, S., Zach, J. (2010) Information Transfer in a TEM Corrected for Spherical and Chromatic Aberration. Microscopy and Microanalysis, 16 (4). 393-408 doi:10.1017/s1431927610013498
Hartel, P, Müller, H, Uhlemann, S, Zach, J, Haider, M (2010) Benefits of Simultaneous Cc- and Cs-Correction. Microscopy and Microanalysis, 16. 114-115 doi:10.1017/s1431927610055133
Haider, M, Hartel, P, Müller, H, Uhlemann, S, Zach, J (2009) Development of Correctors: From O. Scherzer to TEAM. Microscopy and Microanalysis, 15. 150-151 doi:10.1017/s1431927609096275
Kabius, B, Hartel, P, Haider, M, Müller, H, Uhlemann, S, Loebau, U, Zach, J (2009) First Application of Cc Corrected Imaging for High-Resolution and Energy-Filtered TEM. Microscopy and Microanalysis, 15. 1456-1457 doi:10.1017/s1431927609098547
Maβmann, I, Uhlemann, S, Müller, H, Hartel, P, Zach, J, Haider, M, Taniguchi, Y, Hoyle, D, Herring, R (2011) Realization of the First Aplanatic Transmission Electron Microscope. Microscopy and Microanalysis, 17. 1270-1271 doi:10.1017/s1431927611007227
Haider, M, Loebau, U, Hoeschen, R, Mueller, H, Uhlemann, S, Zach, J (2007) State of the Development of a Cc & Cs Corrector for TEAM. Microscopy and Microanalysis, 13. doi:10.1017/s1431927607073412
Haider, M, Hartel, P, Loebau, U, Hoeschen, R, Müller, H, Uhlemann, S, Kahl, F, Zach, F (2008) Progress on the Development of a Cc/Cs Corrector for TEAM. Microscopy and Microanalysis, 14. 800-801 doi:10.1017/s1431927608086960
Hartel, P, Müller, H, Uhlemann, S, Haider, M (2007) First Experimental Results with Advanced Hexapole Cs-Correctors. Microscopy and Microanalysis, 13. doi:10.1017/s1431927607080026
Hartel, P, Müller, H, Uhlemann, S, Haider, M (2007) Experimental Set-up of an Advanced Hexapole Cs-Corrector. Microscopy and Microanalysis, 13. doi:10.1017/s1431927607072777
 
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